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![Download a high-resolution (300dpi) digital image](https://webarchive.library.unt.edu/eot2008/20081103165246im_/http://www.ars.usda.gov/is/graphics/photos/downloadbutton.gif)
Image Number K7590-1 |
Materials engineer Patricia Bel-Berger and chemists Bill Goynes (center) and
Eugene Blanchard examine scanning electron micrographs (SEMs) that show the
structure of a white-speck nep.
Photo by Scott Bauer.
640 pixels wide: (k7590-1.jpg)
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Last Modified: 05/23/2006
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