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Disclaimer
Y.-K. Kim,1 K.K. Irikura,2 M.E. Rudd,3
M.A. Ali,4 and P.M. Stone1
J.S. Coursey,5 R.A. Dragoset,5 A.R. Kishore,5
K.J. Olsen,5 A.M. Sansonetti,5 G.G. Wiersma5
D.S. Zucker,5 and M.A. Zucker,5
1: National Institute of Standards and Technology, Physics Laboratory, Atomic
Physics Division
2: NIST, Chemical Science and Technology Laboratory, Physical and Chemical
Properties Division
3: University of Nebraska-Lincoln, Department of Physics and Astronomy, Lincoln, NE 68588-0111
4: Howard University, Department of Chemistry, Washington, DC 20059
5: NIST, Physics Laboratory, Office of Electronic Commerce in Scientific and
Engineering Data
This is a database primarily of total ionization cross sections of molecules by
electron impact. The database also includes cross sections for some atoms and
energy distributions of ejected electrons for H, He, and H2. The
cross sections were calculated using the Binary-Encounter-Bethe (BEB) model,
which combines the Mott cross section with the high-incident energy behavior of
the Bethe cross section. Selected experimental data are included.
Electron-impact excitation cross sections are also included for some selected
atoms.
Contributions of the following colleagues are gratefully acknowledged:
W. M. Huo, NASA Ames Research Center, Moffet Field, CA 94035-1000
W. Hwang, Samsung Electronics, Suwon, Korea
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