Oak Ridge National Laboratory Review

Volume 29, Number 3, 1996


This colorful map of texture in a substrate for a superconducting film was produced by ORNL's computerized field-emission-gun scanning electron microscope, which analyzes patterns of electrons backscattered from crystalline planes of atoms. This capability was essential to understanding the grain-boundary structure of bismuth- and thallium-based superconductors that carry large amounts of current and to optimizing the texture of buffered nickel and copper substrates for superconducting tapes. See articles, "Hot Wire: A New Foundation for Superconductors" and "Unlocking Electronic Gridlock: ORNL's Search for the Winning Combination," for a discussion of ORNL's exciting development of short superconducting tapes using textured substrates, which recently received a NOVA Award for Teamwork from Lockheed Martin Corporation. The cover was designed by Dave Cottrell, graphic artist in the Computing, Information, and Networking Division.



FEATURES

Hot Wire: A New Foundation for Superconductors
By Carolyn Krause

Unlocking Electronic Gridlock: ORNL's Search for the Winning Combination

By Carolyn Krause

Atomic Balm: Finding Hope in Isotopes

By Kit Carlson

ORNL's War on Crime, Technically Speaking

By Pete Xiques

Life on Earth: Why Biodiversity Varies

By Carolyn Krause

Biosensors and Other Medical and Environmental Probes

By K. Bruce Jacobson

Hybrid Lighting: Illuminating Our Future

By Michael R. Cates



DEPARTMENTS

R&D Updates

Technical Highlights

Technology Transfer


Where to?

Next article | Search | Mail | Review Home Page | ORNL Home Page ]