Laboratory Facilities
* Asterisks indicate that apparatus is unique or one of only a few in the world
Materials Preparation and Film Deposition
- Computer-controlled, ultra-high-vacuum deposition system
- Computer-controlled, ultra-high-vacuum, multi-target sputtering system with in-situ measurement of magnetoresistance*
- Laser-ablation system
- Anaerobic chamber
- Electron-beam deposition system
- Electron-beam lithography
- Optical lithography
- Furnaces for preparation of micro-electromechanical systems, including boron diffusion doping, wet and dry oxidation, and low-pressure chemical-vapor deposition of polysilicon, silicon nitride, and low-temperature oxide
- Deep reactive ion etcher
- Critical-point dryer
- Furnaces for reacting superconductors
Structural Characterization
- High-resolution X-ray diffractometer
- Scanning electron microscope with X-ray fluorescence
- Atomic-force microscope
- Scanning-tunneling microscope
- Reflection high-energy electron diffraction
Characterization of Magnetic Materials
- Vibrating-sample magnetometer
- AC susceptometer
- SQUID magnetometer
- Alternating-gradient force magnetometer
- Induction-field looper
- Time-resolved second-harmonic magneto-optic Kerr effect*
- Wide-field magneto-optic microscope
- Microwave pulsed-magnetic-field sources
- Pulsed inductive microwave magnetometer*
- Magnetic-force microscope
- Magnetic-resonance force microscope*
- Ferromagnetic-resonance probe microscope*
- Microresonating torque magnetometer*
- Optical cryostat with split-pair superconducting magnet
- Time-resolved magneto-optic Kerr effect with vector sensitivity*
- Molecular force puller for single-molecule measurements
- Fluorescence stereo microscope
Characterization of Magnetic Devices
- Local magnetoresistance scanning-probe station
- Time-resolved magnetoresistance of magnetic random-access memory devices*
- Variable-temperature microwave probe station
- Microwave probe station for developing micromachined high-frequency probes*
Characterization of Superconductors
- Large-bore superconducting magnets up to 18.5 teslas
- Measurement of critical current up to 2500 amperes*
- Low-resistance (1 nano-ohm) measurements of stabilizer materials
- Simulation of superconductor transport properties at room temperature*
- Low-noise, 1000 ampere DC power supply with current ramp rates up to 10 000 amperes per second
- High-field electromechanical measurement apparatus (axial, transverse, and hoop stress)*
- Stress-strain apparatus for measurements at room temperature and cryogenic temperatures
- Measurement of electrical transport and noise in superconductor interfaces
- Magnetic measurement of AC losses in superconductors
- Variable-temperature critical-current measurements up to 500 amperes