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| semiconductors: resistivity | EEEL/1981 | test methods | increase productivity | SRR: 181%
BCR: 37 |
| semiconductors: thermal conductivity | EEEL/1981 | materials properties
test methods |
increase R&D
efficiency lower transaction costs |
SRR: 63%
BCR: 5 |
| semiconductors: wire bonding | EEEL/1981 | test methods | increase productivity
increase R&D efficiency |
SRR: 140%
BCR: 12 |
| communications: electromagnetic interference | EEEL/1991 | test methods | lower transaction costs | SRR: 266%
BCR: |
| semiconductors: electromigration | EEEL/1992 | test methods | increase R&D
efficiency transactions costs |
SRR: 117% |
| photonics: optical fiber | EEEL/1992 | test methods
(acceptance) |
lower transaction costs | SRR: 423%
BCR: |
| automation: real-time control systems | MEL/1995 | generic
architecture |
increase R&D efficiency | SRR: 149%
BCR: |
| energy: electric meter calibration | EEEL/1995 | test methods
(calibration) |
lower transaction costs | SRR: 117%
BCR: 12 |
| communications: ISDN | ITL/1995 | interoperability
standards |
lower transaction costs | SRR: 156%
BCR: |
| computers: software conformance | ITL/1995 | test methods
(acceptance) |
lower transaction costs | SRR: 41%
BCR: |
| photonics: spectral irradiance | PL/1995 | test method
(calibration) |
increase productivity
lower transaction costs |
SRR: 145%
BCR: 13 |
| construction: building codes | BFRL/1996 | technical basis
for standards |
energy conservation
energy cost savings |
SRR*: 57%
BCR: |
| construction: roofing shingles | BFRL/1996 | materials
properties |
increased durability | SRR*: 90%
BCR: |
| construction:
fire safety evaluation system |
BFRL/1996 | technical basis
for standards |
lower compliance costs | SRR*: 35%
BCR: |
| automation:
machine tool software error compensation |
MEL/1996 | quality control
algorithm |
increase R&D
efficiency increase productivity |
SRR: 99%
BCR: 85 |
| materials: thermocouples | CSTL/1997 | standard reference
data (calibration) |
lower transaction
costs increase product quality |
SRR: 32%
BCR: 3 |
| pharmaceuticals:
radiopharmaceuticals |
PL/1997 | standard reference materials | increase product quality | SRR: 138%
BCR: 97 |
| photonics:
optical detector calibration |
PL/1997 | standards and
calibration services |
increase productivity | SRR: 72%
BCR: 3 |
| chemicals: alternative refrigerants | CSTL/1998 | standard reference
data |
increase R&D
efficiency increase productivity |
SRR: 433%
BCR: 4 |
| materials:
phase equilibria for advanced ceramics |
MSEL/1998 | standard reference
data |
increase R&D
efficiency increase productivity |
SRR: 33%
BCR: 10 |
| semiconductors:
software for design automation (IGBT semiconductors) |
EEEL/1999 | software model | ncrease R&D
efficiency increase productivity |
SRR: 76%
BCR: 23 NPV: $10M |
| pharmaceuticals:
cholesterol measurement |
CSTL/2000 | standard reference materials | increase productivity
decrease transaction costs |
SRR: 154%
BCR: 4.5 NPV: $3.5M |
| photonics:
laser and fiberoptic power and energy calibration |
EEEL/2000 | calibrations | increase productivity
decrease transaction costs |
SRR: 43%-136%
BCR: 3-11 NPV: $48M |
| electronics:
Josephson voltage standard |
EEEL/2001 | standard reference materials | Increase R&D
efficiency Increase productivity Enable new markets |
SRR: 877
BCR: 5 NPV: $18M |
| chemicals:
SRMs for sulfur in fossil fuels |
CSTL/2000 | standard reference materials | increase productivity
reduce transaction costs |
SRR: 1,056%
BCR: 113 NPV: $409M |
| communications:
security (data encryption standards) |
ITL/2001 | standard
conformance test methods/services |
Increase R&D
efficiency
Enable new markets |
SRR: 267-272%
BCR: 58-145 NPV: $345M-$1.2B |
| communications: security (role-based access control) | ITL/2001 | generic technology reference models | Enable new markets Increase R&D efficiency |
SRR: 44%
BCR: 109 NPV: $292M |
| chemicals: National Traceable Reference Materials Program (NTRM) | CSTL/2002 | reference data; calibration services | Increase efficiency of regulatory compliance (content & production efficiencies for standards) | SRR:
221% BCR: 21 NPV: $49M |
| manufacturing: standards for product data exchange (STEP) | MEL/2002 | standards development; conformance test methods/services | Increase quality and assimilation of standards; accelerate standards development | SRR:
32% BCR: 8 NPV: $180M |
Measures:
SRR: social (internal) rate of return
SRR*: social (implied) rate of return
BCR: benefit-cost ratio
NPV: net present valueNIST Laboratories (OUs):
EEEL: Electronics and Electrical Engineering
MEL: Manufacturing Engineering Laboratory
CSTL: Chemical Science and Technology Laboratory
PL: Physics Laboratory
MSEL: Materials Science and Engineering Laboratory
BFRL: Building and Fire Research Laboratory
ITL: Information Technology LaboratoryLast edited: January 15, 2003
Contact: Gregory Tassey