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Media Count:
N/A
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Date:
Feb 1996
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Author:
C. Dezhang Z. Chengquan
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The perpetual laser damage effects of silicon PIN photoelectric diodes and silicon avalanche photodiodes irradiated by a laser of 1. O6um or 0.53um wavelength are studied. The laser damage thresholds of the detectors are experimentally measured. The main ...
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Report Number:
NAIC-ID(RS)T-0577-95
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Contract Number:
N/A
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Project Number:
N/A
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Grant Number:
N/A
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Task Number:
N/A
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NTIS announcement issue:
9618
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"N/A" indicates no data is available for this field.
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