Beamline X7B
General Information
Source Type Bending Magnet Status Operational General User Beamtime 25% Energy Range 5-21 keV
Beamline Type Participating Research Team (PRT) Technique(s) X-ray diffraction, single crystal X-ray diffraction, time resolved X-ray diffraction, wide angle X-ray scattering, wide angle
Institution(s) Brookhaven National Laboratory, Chemistry Dept. General Electric
Research Types Crystallography, wide angle scattering, time-resolved diffraction.
Contact Information
Spokesperson
Jose Rodriguez, Brookhaven National Laboratory, rodrigez@bnl.gov, 344-2246 Jonathan Hanson, Brookhaven National Laboratory, hanson1@bnl.gov, 344-4378
Local Contact
Jonathan Hanson, Brookhaven National Laboratory, hanson1@bnl.gov, 344-4378
Beamtime Scheduler
Jonathan Hanson, Brookhaven National Laboratory, hanson1@bnl.gov, 344-4378
Beamline Phone
631-344-5707
Instrumentation
Beamline Characteristics
Energy Range |
Mono Crystal or Grating |
Resolution (ΔE/E) |
Flux |
Spot Size (mm) |
Total Angular Acceptance (mrad) |
35-50 keV |
Si(311) |
2 x 10-3 |
1x 1011 ph/sec (calc. @ 35 keV, 500 mA, 2.8 GeV) |
0.3H x 1.0V(1% variable for intensity)(design) |
2 |
Source Type Bending magnet Optical System Monochromator: Focusing 2 bent Laue crystal monochomater. Experimental Apparatus Radiation hutch. XYZ lift table with 500 - 800 lbs. Capacity. Heaters and controllers for temperatures up to 900C. SRS rare gas analyzer. Scintillation and ionization detectors. Mar345 image plate system. Computer System Hardware & Software LINUX computer for Mar345 detector, PC running LINIX and PC running windows 2000. Software: HKL package, NSLSDAC and FIT2D software.
Links
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