National Institute of Standards and Technology (NIST)
National Science Foundation (NSF)
Office of Naval Research (ONR)

The National Science and Technology Council (NSTC) Subcommittee on Nanoscale Science, Engineering, and Technology (NSET)

Maryland Department of Business and Economic Development, Ben Franklin Technology Partners (Pennsylvania), the Northern Virginia Technology Council, the Nanotechnology Institute, and the Mid-Atlantic Nanotechnology Alliance

Michael T. Postek (NIST)
Kevin Lyons (NSF)

James Murday and Khershed Cooper (DOD)
Diana Bauer and Nora Savage (EPA)
Trey Thomas (CPSC)
Meyya Meyyappan and Raj Kaul (NASA)
Tim Fitzsimmons and Julianne Levings and David Prigel (DOE)
William Chernicoff (DOT)
Vladimir Murashov (CDC)
Susan Skemp
RoseAnn Rosenthal (BFTP)
Ajay Malshe (UA)
Avi Bar-Cohen (UM)

Through presentations and breakout sessions, the workshop will identify technical challenges for instrumentation, metrology and standards for manufacturing at the nanoscale, and appropriate roles for academia, industry, and government.

Nanomanufacturing is the essential bridge between the discoveries of nanoscience and real world nanotech products it is the vehicle by which the Nation will realize the promise of major technological innovation across a spectrum of products that will affect virtually every industrial sector. For nanotech products to achieve the broad impacts envisioned, they must be manufactured in market-appropriate quantities in a reliable, repeatable, and commercially viable manner. In addition, they must be manufactured so that environmental and human health concerns are met, worker safety issues are appropriately assessed and handled, and liability issues are addressed. Critical to this realization of robust nanomanufacturing is the development of the necessary instrumentation, metrology, and standards. This will allow the physical dimensions, properties, functionality, and purity of the materials, processes, tools, systems, products, and emissions that will constitute nanomanufacturing to be measured and characterized. This will in turn enable production to be scaleable, controllable, predictable, and repeatable to meet market needs. If a product cannot be measured, it cannot be manufactured.

This workshop will bring together experts in instrumentation, metrology, computational methods, and manufacturing processes, as well as those who depend on accurate measurements, to discuss and document progress made to date in these various areas, especially focusing on advancements since the January 2004 NNI Grand Challenge workshop on Instrumentation and Metrology (report now available at: www.nano.gov). The workshop will focus on the identification of technical challenges that need to be undertaken as well as the directions the community feels it needs to take going forward. A set of research recommendations will be identified will be compiled from discussions at the workshop.

The National Institute of Standards and Technology (NIST)

Registration Deadline: October 13, 2006

Conference Brochure (pdf)

There is no registration fee for the Workshop. However, attendance will be capped at 200 people maximum. Pre-registration is required by NIST Security for entry onto the NIST campus for the reception. This rule is strictly enforced. A web form has been implemented to streamline the process. By registering, you are agreeing to actively participate in the breakout sessions.

After submitting the form, you will receive an e-mail confirming your reservation. If you have any questions or problems registering, please contact:

The workshop will be held on October 17-19, 2006. The workshop is scheduled for two and one-half days. The first half of each of the first two days is devoted to talks from experts from various nanomanufacturing sectors. The remainder of the time is devoted to facilitated break-out sessions for practical technical discussions and documentation of current and emerging needs and solutions. It is expected that all registrants will actively participate in the breakout sessions.

The workshop will be held at the Gaithersburg Holiday Inn. A block of rooms has been set aside for attendees at the NIST rate of $104/day single or double.

Holiday Inn Gaithersburg
2 Montgomery Village Avenue
Gaithersburg, MD 20879 (Map and Directions)
Phone:  (301) 948-8900
Fax:  (301) 258-1940
Toll Free: 1-800-HOLIDAY
Website:  http://www.higaithersburg.com/
Location/Directions:  http://www.higaithersburg.com/location.php

NIST is located approximately one mile west of the Gaithersburg Holiday Inn just off Interstate Route 270, about 25 miles (40 kilometers) from the center of Washington, D.C. If you wish to use an Internet map service to locate the NIST campus, you might need the street address of NIST:

National Institute of Standards and Technology
100 Bureau Drive
Gaithersburg, MD 20899 (Map and Directions)

Local Driving Directions to NIST:

From northbound I-270 take Exit 10, Route 117 West, Clopper Road.
At the first light on Clopper Road.
At next stop light (Bureau Drive) turn left onto NIST grounds.

From southbound I-270 take Exit 11, MD Route 124, Montgomery Village Avenue/Quince Orchard Road.
Bear right at the traffic light at the end of the off-ramp onto MD Route 124 West, Quince Orchard Road.
At the second light on Quince Orchard Road, turn left onto MD Route 117, West Diamond Avenue.
At next stop light (Bureau Drive) turn right onto NIST grounds.

Directions from Local Airports:

Driving Directions from Washington Dulles International Airport (IAD):

Follow the Dulles Access Road to Bethesda/Baltimore entrance ramp to 495.
Take 495 (left lane exit) to 270 North.
Take Exit #10 toward Clopper Road (MD 117) and Quince Orchard Road (MD 124).
At the first light turn right onto Clopper Road.
At next stop light (Bureau Drive) turn left onto NIST grounds.

Driving Directions from Baltimore Washington International Airport (BWI):

Take 195 West.
Take 95 South Exit #4B toward Washington.
Take 495 West Exit #27-25 toward College Park/Silver Spring.
Take 270 North Exit #35 toward Frederick.
Take 270 Local North toward Montrose Road.
Take Exit #10 toward Clopper Road (MD 117) and Quince Orchard Road (MD 124).
At the first light turn right onto Clopper Road.
At next stop light (Bureau Drive) turn left onto NIST grounds.

Driving Directions from Ronald Reagan Washington National Airport:

Exit National Airport heading north on the George Washington (GW) Parkway toward Maryland.
Take the GW Parkway to 495 North toward Maryland.
Take 495 (left lane exit) to 270 North.
Take Exit #10 toward Clopper Road (MD 117) and Quince Orchard Road (MD 124).
At the first light turn right onto Clopper Road.
At next stop light (Bureau Drive) turn left onto NIST grounds.

Airport Service to NIST:

P&A Transport Services
Cell:  (301) 318-0103 / (301) 404-7757 / 301-613-4346
Email:  akkarachelle@aol.com

Metrorail (Subway) Access to NIST:

NIST is accessible via the Washington Metropolitan Area Transit Authority and stations, the system map, fares are on their web site. NIST is closest to the last stop on the Red Line (Shady Grove station), but it is a ten-minute drive from the Shady Grove station to the NIST campus. NIST provides shuttle service (to NIST only) for official visitors and staff to and from the Shady Grove Metro Station. Visitors using Metro can meet the NIST shuttle at the east side "Kiss & Ride" area of the Shady Grove Metro Station at 15 and 45 minutes past the hour from 8:00 am to 5:30 pm. The shuttle departs from the front of the NIST Administration Building on the hour and half hour, and stops at NIST North four minutes later on the way to the Metro station.

Find Hotels/Motels - Gaithersburg Area on the NIST website.

Gaithersburg Hilton
620 Perry Parkway, Gaithersburg, MD 20877
Phone:  (301) 977-8900
Fax:  (301) 869-8597

Courtyard Marriott-Gaithersburg
805 Russell Avenue, Gaithersburg, MD 20879
Phone:  (301) 670-0008
Fax:  (301) 948-4538

Holiday Inn
2 Montgomery Village Avenue, Gaithersburg, MD 20879
Phone:  (301) 948-8900
Fax:  (301) 258-1940

Motel 6
I-270 South exit #11, North exit #10
497 Quince Orchard Road, Gaithersburg, MD 20878
Phone:  (301) 977-3311
Fax:  (301) 990-1053

Find NIST Gaithersburg Visitor Information on the NIST website.

Day 1-Tuesday October 17

7:30

Coffee

8:20

Welcoming

8:30

Introduction and Review of the Research Needs Identified in the 2004 Instrumentation and Metrology Workshop, Michael T. Postek, Assistant to the NIST Director for Nanotechnology, National Institute of Standards and Technology, Gaithersburg, MD

8:45

Introduction to the Toward Predictive NanoMaterial Design Session, Dan Herr, Material and Process Sciences Research, Semiconductor Research Corporation, Durham, NC

8:50

Nanometrologies Needed for the Monolithic Fabrication of Nanoscale Electronic Devices and Circuits, Skip Rung, President and Executive Director, Oregon Nanoscience and Microtechnologies Institute (ONAMI) Corvallis, OR

9:10

Nanometrology Challenges Facing the Chemical Industry, Donald B. Anthony, President and Executive Director, the Council for Chemical Research, Washington, DC.

9:30

Past, Present, and Future Challenges for Nanomaterials Manufacturing at DuPont, Gregory S. Blackman, Sr. Research Associate DuPont CR&D/Corporate Center for Analytical Sciences, Wilmington, DE.

9:50

Challenges and opportunities in nanotechnology for aerospace, Thomas Tsotsis, Technical Fellow, Boeing Phantom Works, Boeing Company Huntington Beach, CA.

10:10

Break

10:30

Research Priorities for Analytical Methods for Characterization of Lignocellulosic Materials, Lori A. Perine, Executive Director, Policy Analysis & Research and Agenda 2020 Technology Alliance, American Forest & Paper Association, Washington DC.

10:50

Challenges and opportunities in nanotechnology for the automotive industry, Jean Dasch, Senior Staff Research Scientist, General Motors Research and Development, Detroit, MI

11:10

Measurement Challenges in Carbon Nanotube Manufacturing, Sivaram Arepalli, Staff Scientist at G. B. Tech., Inc. and NASA Johnson Space Center, Materials and Manufacturing Division, Houston, TX

11:30

Metrology Challenges for Emerging Nanotechnology Manufacturing, Professor Robert Geer, Assistant Vice President for Academic Affairs and Associate Professor of Nanoscience College of Nanoscale Science and Engineering, Albany NanoTech, NY.

11:45

Real Time Excursion Control for Nanomanufacturing Effectiveness, Erez Golan, Technology Project Manager, Applied Materials, Inc. and the College of Nanoscale Science and Engineering - NanoEconomic Program. Albany NanoTech, NY.

11:50

Lunch

01:30

Breakout Set 1

Electronics

Composites/Materials

Pharma/Biomedical

Chemical

03:00

Break

03:15

Breakout Set 1 (continued)

05:45

Bus or Drive to NIST
(note: Conference badge and driver's license/passport identification required for entry)

06:00

Reception

• Food/Drink
• Posters
• Table Top exhibits
• Laboratory Visits
  • Critical Dimension Atomic Force Microscopy - Ted Vorburger and Joseph Fu
  • 3-D Chemical Characterization at the Nanoscale - John Henry Scott
  • Nano-Force Metrology - Jon Pratt(note: please sign-up for this tour at the registration desk)
  • Nano-optics for Chemical and Materials Characterization - Stephan J. Stranick
  • Optical Manipulation of Nanoparticles - Thomas LeBrun
  • Magnetic-Field-Induced Assembly of Magnetic Nanoparticles - Angela Hight-Walker
  • Scanning Electron Microscope Metrology - Andras Vladar
  • SURF III Synchrotron Ultraviolet Radiation Facility (note: please sign-up for this tour at the registration desk)

08:00

Return via bus or car back to hotel

Day 2-Wednesday October 18

07:30

Coffee

08:30

Process Check

08:45

Breakout Report-out 1a Electronics

09:00

Breakout Report-out 1b Composites/Materials

09:15

Breakout Report-out 1c Pharma/Biomedical

09:30

Breakout Report-out 1d Chemical

09:45

Group Discussion-Q and A

10:00

Break

10:30

Metrology Challenges for Nanotechnology-A Semiconductor Manufacturer's Perspective. John Allgair, International SEMATECH Manufacturing Initiative, Austin TX.

10:50

Metrology and Instrumentation Challenges in Nanomanufacturing, John Randall, Chief Technical Officer, Zyvex Corporation, Dallas TX.

11:10

Making predictions...Measuring Progress, Michael N. Thompson, Business Development Manager-Nanotechnology, FEI Company, Hillsboro, OR

11:30

An Industry Perspective on the need for Measurement and Metrology Standards for Nanotechnology, Jonathan Tucker, Lead Marketing Engineer - Nanotechnology, Keithley Instruments, Cleveland OH.

11:50

Challenges and Opportunities in Nanotechnology in Nanobiotechnology, Deb Newberry, President, Newberry Technologies, Inc. and Dakota County Community College, Rosemount, Minnesota

12:10

Lunch

01:30

Breakout Set 2

03:00

Break

03:15

Breakout Set 2 (continued)

05:15

Dinner (on your own)

Day 3-Thursday October 19

07:30

Coffee

08:30

Process Check

08:40

Breakout Report-out 2a Electronics

09:00

Breakout Report-out 2b Composites/Materials

09:15

Breakout Report-out 2c Pharma/Biomedical

09:30

Breakout Report-out 2d Chemical

09:45

Group Discussion-Q and A

10:00

Break

10:30

Separate into writing groups develop assignments

12:00

Lunch

01:00

Toward Predictive NanoMaterial Design (Experimentation, Metrology, EHS, Modeling and Critical Algorithms), Michael Garner, INTEL, Santa Clara; Dan Herr, Semiconductor Research Corporation, Durham, NC and Donald B. Anthony, Council for Chemical Research, Washington, DC. and others TBD (moderators)

3:00

Break

3:30

Resume Meeting

5:00

End of Workshop

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Date created: July. 03, 2006
Last updated: Oct. 13, 2006