Title: Method of bumping a thin wafer

Aliases: Low profile SiP

Technical Challenge: Portable electronic devices such as PDAs are pushing the limits of electronic miniaturization. The drive to get more performance with limited physical space requires a continuous improvement in densifying electronic assemblies. Even the thickness of the integrated circuits is being reduced. At the same time, high yields and manufacturability processes are needed to keep costs down.

Description: This invention addresses fabricating very thin wafers with solder bumps for advanced chip-scale packaging that eliminates technical problems such as handling and alignment associated with flip-chip attachment. By using this method, extremely thin chip scale packages can be manufactured reliably, with high yield, and using standard equipment sets.

    Demonstration Capability: Samples available for evaluation. Run sheets for the method are available. Process demonstrations are also available.

    Potential Commercial Application(s): Portable electronic devices, high density and high-speed electronic modules, and ultra-miniature chip assemblies.

    (Updated) Patent Status: Patent Application has been filed with USPTO.

    Reference Number: 1351

    If you are interested in exploring this technology further, please call 443-445-7159 or express your interest in writing to the National Security Agency, Domestic Technology Transfer Program, 9800 Savage Road, Suite 6541, Fort George G. Meade, Maryland 20755-6541.