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NIST Meeting Results
International Metrology Interoperability Summit 2006
Consortium of Consortia (CoC) meeting
High-level Inspection Process Planning (HIPP) meeting

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Metrology Interoperability Home
Automotive Industry Action Group

Metrology Interoperability Project Team (MIPT)
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MIPT Standards Landscape

NIST
NIST Activities
DMIS Test Suite

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Analysis of Metrology Standards: Presentation
Analysis of Metrology Standards: Report
IMTS 2004
"Save Time and Money" Presentation
Demo Trip Report (pdf)
Quality Expo/Control 2005
Demo Trip Report (pdf)
IDW 2005 Presentation (pps)
IDW Paper (pdf)
CMSC 2006


Standards Efforts
Dimensional Markup Language (DML)
Dimensional Metrology Standards
Consortium (DMSC)
I++DME Team
I++DME Specifications
NIST STEP-NC Activities


Metrology Interoperability:

Interface Standards for Components of
Dimensional Metrology Systems

The Motivation: Dimensional Metrology Products that support standards can save you time and money. (View a NIST presentation, shown at IMTS 2004). Standards help solve the interoperability problem.

What is the interoperability problem?

  • Metrology systems typically comprise products from multiple vendors

  • Can a user "design his own system" with components from different vendors (like with Personal Computer (PC) components)? Not easily, not cheaply, and sometimes not at all!

  • These components typically do not communicate well with one another unless they all come from the same vendor

  • This is called the "interoperability problem," and is known to cause large and unnecessary costs to both users and vendors

What is the cost of the interoperability problem?

Look only at the domain of quality measurement results data. SPC vendors typically consume this data and quality measurement device vendors and SPC vendors produce it. A key SPC software worker (Robert Brown of Mitutoyo) claims, without objection from any of the other key workers, that his group actually performs about one quality measurement data translation per week. Another key SPC software worker (Dane Barrager of ASI DataMyte) claims, without objection from any of the other key workers, that it costs them $5,000 for each translation effort to accommodate a new quality measurement data format. Assuming there are about 20 SPC vendors in the U.S. alone, the translation cost to U.S. quality measurement data software vendors is roughly $5,000 x 52weeks/year x 20 vendors = $5,200,000 per year.

Industry insiders also claim that as many as 6,000 different quality measurement data formats currently in use. Using this number, the total cost per vendor is $5,000 x 6,000 formats = $30,000,000 per vendor. These SPC vendors or the SPC divisions of larger corporations commonly have somewhere around 10 - 20 employees. $30 Mil is clearly a substantial financial burden to these relatively small companies/divisions.

All these costs passed onto the end user and ultimately to the customer.

How can you and your company benefit from these standards?

  • Products that support standards can more easily interconnect

  • Training and maintenance costs are reduced

  • Non-value-added program translations are reduced

  • Flexibility in choice of components is increased

  • Product costs are reduced, due to increased competition among vendors

What are the standards that help solve this interoperability problem?

The figure below shows the common components in metrology systems and their various communications interfaces. The standards define the communications languages on these interfaces.

DIMENSIONAL METROLOGY STANDARDS LANDSCAPE

This figure illustrates four main interfaces: CAD Geometry and Tolerance, Off-line Programming, CMM Execution Commands, and CMM Measurement Results Output. The applicable standards are: STEP, DMIS, I++DME, and DML.

Who are the players in this effort and what are their roles?

Metrology Interoperability Project Team of the Automotive Industry Action Group is central to this effort. It consists of users and vendors, working together to achieve interoperability of software and hardware in automated metrology, in order to reduce product development cycle time and reduce manufacturing costs. This group was not formed to compete with existing standards groups (such as the Dimensional Metrology Standards Consortium (DMSC)), but merely to keep an eye of the "big picture" … to be an "umbrella" group that oversees all the metrology interface standards efforts worldwide, The MIPT seeks to harmonize standards overlaps and fill in gaps where they exist.

NIST - we advise, support, and perform tasks for this standards effort. We develop tests for verifying compliance of implementations to each standard (NIST's current activity has focused on the I++DME and DML standards). We perform detailed standards analysis, as requested by the industry. We maintain a metrology interoperability testbed at NIST in Gaithersburg, MD, that is actually part of a distributed testbed with active participants worldwide. NIST's role in this overall effort is critical to its success.

International Association of CMM Manufacturers (IA.CMM)- The purpose of the Association is to support and to promote the interests of the world-wide industry of coordinate measuring machines technologies. It sponsors the I++DME Team, which develops and maintains the I++DME Specification.

Dimensional Metrology Standards Consortium (DMSC) - The DMSC grow out of the DMIS National Standards Committee (DNSC) and the DMSC has assumed responsibity for the maintenance and support of the DMIS Standard. However, the new mission of this group has expanded to address the development of other dimensional metrology standards.

European DMIS Users Group - (EDUG) Chairman: Lutz Karras (Carl Zeiss), Vice Chair: Marcel Lenher (Metromec), Secretary: Gerd Becker (DaimlerChrysler).

Recent activities in dimensional metrology interoperability

IMTS 2004 demonstration of interoperability: NIST and several vendors demonstrated product interoperability of the I++DME and DML interfaces at the 2004 IMTS Show . Read the NIST trip report* (pdf). View the booth posters, Posters 1, Posters 2, Posters 3.

Quality Expo 2005 and Control 2005 demonstrations of interoperability: NIST and several vendors demonstrated product interoperability of the I++DME and DML interfaces at these important trade shows. The functionality of these demonstrations was substantially expanded from that performed in the IMTS 2004 demonstration. Read the NIST trip report* (pdf).

Contact:
John Horst
National Institute of Standards and Technology
100 Bureau Drive, MS 8230
Gaithersburg, MD 20899-8230

E-mail: john.horst@nist.gov
Voice: 301-975-3430
FAX: 301-990-9688

Please contact the above if you require any documents found at this site in a form other than those provided.

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Date Created: October 27, 2004
Last updated: January 3, 2008