NG1 POLARIZED NEUTRON REFLECTOMETER

This cold neutron instrument is used to study materials of interest in surface and interfacial science, including magnetic multilayers, artificial biological membranes, and semiconductor surfaces. The instrument is most commonly configured for neutron reflectometry, a technique that is sensitive to the depth-dependent composition, and in-plane structure of thin films. The instrument's full polarization capabilities allow for polarized neutron reflectometry, which is sensitive to films' depth-dependent vector magnetization, and in-plane magnetic ordering. Depth distributions of net magnetizations as small as 20 emu/cc can be routinely measured. Refrigerators, furnaces, magnets, liquid cells, and lasers are available for control of sample environment. On-site x-ray reflectometry is available for additional sample characterization. If you're interested in performing an experiment, apply for beamtime, or contact one of the instrument scientists directly. Monetary assistance may be available for new facility users.