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Showcasing our services: Inspection of High Magnification Fracture Surfaces using 3D from Stereo Images of Large Chamber SEM more …

The LC‑SEM can examine an object 40 inches in diameter and 40 inches high, weighing up to 660 pounds and at magnifications up to 50,000x.

High-resolution imaging

• secondary electron detection for topographic imaging
• backscatter electron detection for elemental contrast imaging

Surface characterization

• energy dispersive X‑ray spectrometry for chemical analysis
• Fourier transform infrared spectrometry to analyze nonmetallic materials such as paints, polymers, and corrosion products

Metal microstructure

• electron backscatter diffraction for crystallography of polished samples

Expanded material range

• variable pressure for nonconductive surfaces

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