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Showcasing our services: Inspection of High Magnification Fracture Surfaces using 3D from Stereo Images of Large Chamber SEM more … |
The LC‑SEM can examine an object 40 inches in diameter and 40 inches high, weighing up to 660 pounds and at magnifications up to 50,000x.
High-resolution imaging
- secondary electron detection for topographic imaging
- backscatter electron detection for elemental contrast imaging
Surface characterization
- energy dispersive X‑ray spectrometry for chemical analysis
- Fourier transform infrared spectrometry to analyze nonmetallic materials such as paints, polymers, and corrosion products
Metal microstructure
- electron backscatter diffraction for crystallography of polished samples
Expanded material range
- variable pressure for nonconductive surfaces
Want to know more about our services? Contact us.