NIST Technicalendar July 10 to July 14, 2000 The NIST Technicalendar is issued each Friday. All items MUST be submitted electronically from this web page by 12:00 NOON each Wednesday unless otherwise stated in the NIST Technicalendar. The address for online weekly editions of the NIST Technicalendar and NIST Administrative Calendar is: http://www.nist.gov/tcal/.
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In this Issue: Meetings at NIST Meetings Elsewhere Announcements Talks by NIST Personnel NIST Web Site Announcements NIST Administrative Calendar (current)   NIST Vacancy Announcements (current)

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10:30 AM - Coherence Properties of a Thermal Source Revisited in the Near-Field
11:00 AM - Instabilities in the Flow of Molten Polymers (Secondary Flow, Slip & Rupture)
11:00 AM - Detection of Genomic Alteration by Molecular Combing
2:00 PM - Measuring the Spectral Irradiance of Stars

9:00 AM - NIST-CMU Workshop on Automation Technologies for Construction, Field Measurement, and Inspection
9:00 AM - Value Stream Mapping (LE202)

No Scheduled Events

11:00 AM - DR. MEHURON TO SPEAK ON THE NIST INFORMATION TECHNOLOGY PROGRAM AT STANDARDS ALUMNI ASSOCIATION (SAA) MEETING

10:00 AM - Study of Condensed State of Polymer Single Chains
10:30 AM - Sending Time to the Masses
10:45 AM - Small Angle Scattering Studies of Tubulin Polymers

7/10 -- MONDAY

10:30 AM - ATOMIC PHYSICS DIVISION SEMINAR: Coherence Properties of a Thermal Source Revisited in the Near-Field
The usual example of an incoherent source of light used in textbooks is a thermal source like a light bulb. Yet, such a source may have very surprising coherence properties in the near-field. It will be shown that the light emitted by a half-space at temperature T can be almost monochromatic. It will also be shown that the coherence lenght across the interface can be either much smaller or much larger than the wavelength. Another surprising result is the increase by several orders of magnitude of the radiative density of energy close to the interface when a surface wave such as a phonon-polariton or a plasmon-polariton is excited. Applications to local spectroscopy of semiconductors, radiative heat transfer at nanometer scale and emission of light will be discussed.
Jean-Jacques Greffet , Ecole Centrale, Paris, France.
Physics Building, Room B145. (NIST Contact: Adel Rahmani, 301-975-5029, arahmani@nist.gov) http://www.em2c.ecp.fr/prop_diff_eng.html

11:00 AM - POLYMERS DIVISION SEMINAR: Instabilities in the Flow of Molten Polymers (Secondary Flow, Slip & Rupture)
John Dealy , Dept. of Chemical Engineering, McGill Univ., Montreal, Canada.
Bldg 224, Rm.A312. (NIST Contact: Kalman Migler, 301-975-4876, kalman.migler@nist.gov)

11:00 AM - BIOTECHNOLOGY DIVISION SEMINAR: Detection of Genomic Alteration by Molecular Combing
A. Bensimon , DNA Biophysics Lab., Pasteur Institute, Paris, France.
Advanced Chemical Sciences Lab, CSTL Conf. Rm. A202. (NIST Contact: P. Barker, 301-975-5402, peter.barker@nist.gov)

2:00 PM - OPTICAL TECHNOLOGY DIVISION SEMINAR: Measuring the Spectral Irradiance of Stars
Measuring the spectral irradiance of stars is a critical observational constraint on models of stellar atmospheres, the region that emits the radiation containing all the information we receive from stars. However, the last fundamental effort to measure stellar spectral irradiance was a generation ago in the mid 1970s. Since then, models of stellar atmospheres have improved enormously, thanks largely to the huge increase in computing power. The need for new measurements of irradiance is compounded by the recent development of optical and infrared spatial interferometers, which are imaging the surfaces of stars for the first time in the history of astronomy. It is essential to perform new measurements of spectral irradiance, improved to keep pace with the improved imaging capabilities, to test the current generation of models. This talk will outline a new effort in this field.
John Lester , Astronomy Department, University of Toronto, Canada.
Physics Building, Room B145. (NIST Contact: Howard Yoon, 301-975-2482, hyoon@nist.gov)


7/11 -- TUESDAY

9:00 AM - STRUCTURES DIVISION SEMINAR: NIST-CMU Workshop on Automation Technologies for Construction, Field Measurement, and Inspection
This workshop will bring together diverse interests and talents from within Carnegie-Mellon University (CMU) and the National Institute of Standards and Technology (NIST) to share research directions, develop collaborative ties to leverage research, and to involve industrial partners in determining the driving technical needs in the area of developing standards, communication protocols, and automation technologies for construction, construction metrology, and field inspection of existing infrastructure. Topical areas to be discussed at the workshop will include automation of construction tasks; real-time construction metrology (particularly the automated assessment of the as-built status of commercial and civil infrastructure); the automation of field inspection tasks (particularly bridges in the state and federal highway system and other civil structures); web-based construction information management and usage; and the data communication standards and protocols that need to be developed to enable these advances. Industry, federal, and state agency representatives will provide viewpoints on pressing construction and maintenance information issues.
. . , ..
Advanced Chemical Sciences Lab, Room A202. (NIST Contact: DeWitt Latimer, 301-975-6069, dlatimer@nist.gov)

9:00 AM - MANUFACTURING EXTENSION PARTNERSHIP PROGRAM SEMINAR: Value Stream Mapping (LE202)
Learn how to create a map of the entire value stream and how to map the current state of a product or process with the entire current data and non value-added and then map the future state. Participants will learn the steps necessary to eliminate the waste in the system via the power of value stream map in order to achieve the enhanced future state. Real company examples and case studies to be presented. Participants will bring their own examples and create their own current and future state maps.
Beau Keyte , TecNet.
NIST North Bldg, Rm. LR 152. (NIST Contact: Dede McMahon, 301-975-8328, dmcmahon@mep.nist.gov)


7/12 -- WEDNESDAY

No Scheduled Events

7/13 -- THURSDAY

11:00 AM - OFFICE OF STANDARDS SERVICES SEMINAR: DR. MEHURON TO SPEAK ON THE NIST INFORMATION TECHNOLOGY PROGRAM AT STANDARDS ALUMNI ASSOCIATION (SAA) MEETING
NIST staff members are invited to attend the next quarterly meeting of the SAA, to be held in Lecture Room A on July 13, 2000, at 11:00 AM. Dr. William Mehuron, Director of the Information Technology Laboratory (ITL), will describe ITL's research efforts related to IT measurements and standards in support of industry, service to NIST, and collaborative research in mathematics, statistics, and information sciences. Tours of the Biometrics Lab and the Scientific Visualization Enabling Research Lab will be conducted in the afternoon. For additional information about this meeting or the SAA, please call Reeves Tilley at (301) 762-7186 or the SAA Office at Ext. 2486. Sam Kramer is the SAA President and Walter Leight is the SAA/NIST Liaison. Present members of the NIST staff are invited to join the SAA (annual dues are $15) and to "spread the word" (or send names and addresses to Room 42, Admin; email address--alumni@nist.gov). More than 400 past and present employees, research associates, and guest workers now belong to SAA. The Association conducts activities in information transfer through volunteer services, educational seminars, science fairs, and science talent searches; is a source of information for the NIST history project and the Centennial Celebrations in 2001; and facilitates solutions of problems related to the NIST mission.
Dr. William Mehuron , Director, Information Technology Laboratory.
Administration Bldg, Lecture Rm. A. (NIST Contact: SAA Office, 301-975-2486, alumni@nist.gov)


7/14 -- FRIDAY

10:00 AM - POLYMERS DIVISION SEMINAR: Study of Condensed State of Polymer Single Chains
Yongli Mi , Hong Kong University of Science and Technology.
Bldg 224, Rm. A312. (NIST Contact: Wen-li Wu, 301-975-6839, wen-li.wu@nist.gov)

10:30 AM - OFFICE OF THE DIRECTOR, NIST SEMINAR: Sending Time to the Masses
The NIST Network Time Service responds to more than 25 million requests per day for time in a number of different formats. Demand has grown continuously since the service was started several years ago, and there is no sign that this growth rate is slowing. Dr. Levine will discuss the details of how this service is designed, with particular emphasis on the statistical considerations that determine the accuracy that can be realized using this system. In particular, he will explain the statistical considerations that govern the very explicit tradeoff between the accuracy that can be achieved and the cost of achieving it. Although he will focus on these digital time services, the principles that he will discuss are useful in other applications as well. He will talk briefly about applying them to the construction of time scales in general and the procedure that is used to define UTC(NIST) in particular.
Judah Levine , Physics Laboratory.
Administration Bldg, Green Auditorium. (NIST Contact: Muhammad Arif, 301-975-6303, arif@nist.gov)
Special Assistance Available

10:45 AM - NIST CENTER FOR NEUTRON RESEARCH SEMINAR: Small Angle Scattering Studies of Tubulin Polymers
Ralph Nossal , National Institute of Health.
Bldg 235, Rm. E100. (NIST Contact: Susan Krueger, 301-975-6734, susan.krueger@nist.gov)


ADVANCE NOTICE

7/19/00 10:00 AM - PROGRAM OFFICE SEMINAR: NIST Quarterly Town Meeting
July 19, 2000, 10:00 a.m., Gaithersburg July 20, 2000, 10:00 a.m., Boulder Deputy Director Karen Brown will lead the next NIST Quarterly Town Meetings in Gaithersburg (July 19th at 10:00 a.m. EDT in the Red Auditorium) and Boulder (July 20th at 10:00 a.m, MDT in the Auditorium). The Town Meetings are intended to encourage communication between all staff and senior NIST leaders. Several topics of general interest will be discussed, including topics submitted on the web by NIST staff. ITL Director and acting NIST CIO Bill Mehuron will briefly discuss the current IT services environment, new initiatives and plans to use IT to improve our operations. There will also be time for questions on any topic, including answers to some questions submitted by email. Please plan to attend. Answers to questions submitted by email before the April 2000 Town Meetings are posted at: http://www-i.nist.gov/director/TownMeetings/qas_answered.html
Karen Brown , Deputy Director, NIST.
Administration Building, Red Auditorium. (NIST Contact: Angela Hight Walker, 301-975-3725, angela.hightwalker@nist.gov)
Special Assistance Available

7/20/00 9:30 AM - OFFICE OF INTERNATIONAL AND ACADEMIC AFFAIRS SEMINAR: Visit By The National Research Council Postdoctoral Research Associateships Program Staff
9:30 a.m. - 10:30 a.m. - Meeting with Postdoctoral Research ASSOCIATES 10:30 a.m. - 11:30 a.m. - Meeting with Postdoctoral Research ADVISERS The National Research Council (NRC) will be making their annual visit to meet with NIST advisers, staff, and NIST/NRC Postdocs. This will provide an opportunity for discussion of any questions or issues concerning the postdoctoral program.
Dr. Arnold Schwartz , Director, National Research Council Associateships Program. Dr. Paul Zielinski , Program Administrator, Postdoctoral Research Associateships Program. Ms. Evelyn Simeon, Program Coordinator, Postdoctoral Research Associateships Program
Administration Building, Lecture Room A. (NIST Contact: Janice Campbell, 301-975-3076, janice.campbell@nist.gov)

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MEETINGS ELSEWHERE


7/10 -- MONDAY

No Scheduled Events

7/11 -- TUESDAY

11:00 AM - ORE METAL PARTITIONING AND RELATED EQUILIBRIA IN FELSIC MAGMATIC SYSTEMS
P. Candela , Univ. of Maryland.
Seminar Rm., Main Bldg., GL-DTM Grounds, Carnegie Institution of Washington, DC. (NIST Contact: S. Schmidt, 202-686-2410, schmidt@gl.ciw.edu)



7/12 -- WEDNESDAY

No Scheduled Events

7/13 -- THURSDAY

No Scheduled Events

7/14 -- FRIDAY

No Scheduled Events

ADVANCE NOTICE

No Scheduled Events

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TALKS BY NIST PERSONNEL

BOYNTON, P. : DIAGNOSTICS FOR LIGHT MEASURING DEVICES IN FLYING-SPOT DISPLAY MEASUREMENTS.
American National Standards Institute/Photographic and Imaging Manufacturers Association Committee Meeting, San Jose, CA, 6/16.

SCOTT, J. : GATE DIELECTRIC THICKNESS METROLOGY USING TRANSMISSION ELECTRON MICROSCOPY.
2000 International Conf. on Characterization and Metrology for ULSI Technology, NIST, Gaithersburg, MD, 6/26.

WHEELER, M. : A STUDY OF INTERACTIONS BETWEEN HEATED GAS MICROSENSOR ELEMENTS OPERATING IN CLOSE PROXIMITY.
8th International Meeting on Chemical Sensors, Convention Center, Basel, Switzerland, 7/4.

WIGHT, S. : CHARACTERIZATION OF THE ELECTRON BEAM SPECIMEN INTERACTION IN THE ESEM WITH SIMS.
International Union of Microbeam Analysis Societies (IUMAS), Kailua-Kona, HI, 7/10.

ETZ, E. : RAMAN INTENSITY CALIBRATION WITH GLASS LUMINESCENCE STANDARDS.
International Union of Microbeam Analysis Societies (IUMAS-2000), Kona, HI, 7/10.

BERG, R. : NIST WORKSHOP ON MASS FLOW MEASUREMENTS AND CONTROL.
SEMICON West Conf., San Francisco, CA, 7/10.

ARMSTRONG, J. : OPTIMAL METHODS FOR THE QUANTITATIVE ANALYSIS OF INDIVIDUAL MICROPARTICLES AND IRREGULAR SURFACES.
International Union of Microbeam Analysis Societies (IUMAS), Kailua-Kona, HI, 7/10.

BOISVERT, R. : JAVA PROSPECTS AND PLANS: THE JAVA GRANDE FORUM NUMERICS WORKING GROUP.
SIAM Annual Meeting, San Juan, Puerto Rico, 7/11.

MCWHORTER, D. : ULTRAFAST TERAHERTZ SPECTROSCOPY: MEASURING LOW-FREQUENCY VIBRATIONAL MODES OF HYDROGEN-BONDED SYSTEMS.
Optical Society of America, Charlestown, SC, 7/11.

POZO, R. : PERFORMANCE EVALUATION OF JAVA FOR NUMERICAL COMPUTING.
SIAM Annual Meeting, San Juan, Puerto Rico, 7/11.

NEWBURY, D. : QUANTITATIVE X-RAY MICROANALYSIS OF ROUGH SURFACES.
2nd International Union of Microbeam Analysis Society, Kona, HI, 7/11.

KOPANSKI, J. : SCANNING CAPACITANCE MICROSCOPY FOR MEASURING DEVICE CARRIER PROFILES BEYOND THE 100NM GENERATION..
Microprocesses and Nanotechnology Conference 2000., University of Tokyo, Komaba Campus, Japan, 7/12.

SMALL, J. : ACTIVITIES OF THE ISO TC 202 MICROBEAM ANALYSIS.
International Union of Microbeam Analysis Societies, Kailua-Kona, HI, 7/13.

MARINENKO, R. : STATUS OF MICROANALYSIS STANDARDS AT THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY.
International Union of Microbeam Analysis Societies (IUMAS), Kailua-Kona, HI, 7/13.

SMALL, J. : IMPROVING ACCURACY OF PARTICLE ANALYSIS.
International Union of Microbeam Analysis Societies (IUMAS), Kailua-Kona,HI, 7/13.

LOZIER, D. : A NEW WEB-ENABLED COMPENDIUM ON SPECIAL FUNCTIONS.
SIAM-OPSF Minisymposium, San Juan, PR, 7/13.

GERMER, T. : FIRST ORDER VECTOR PERTURBATION THEORY: WHAT ARE ITS LIMITS?.
The Progress in Electromagnetics Research Symposium 2000, Cambridge, MA, 7/13.

LEE, A. : ACCELERATED LIFE-TESTING OF MEMS PRESSURE.
NCSL 2000 Workshop and Symposium, Westin Harbour Castle, in Toronto, Canada, 7/15.

LARASON, T. : IMPROVEMENTS IN NIST UV PHOTODETECTOR MEASUREMENT SERVICES.
NCSL 2000 Workshop and Symposium, Toronto, Ontario, Canada, 7/15.

MIILLER, A. : PRESSURE STANDARDS IN THE BAROMETRIC RANGE.
NCSL 2000 Workshop and Symposium, Toronto, Canada, 7/16.

DRIVER, R. : NCSL PRESSURE COMPARISON AT 0.69 MPA AND 1.4 MPA.
NCSL 2000 Workshop and Symposium, Westin Harbour Castle in Toronto Canada, 7/16.

GILLILAND, G. : BIOTECHNOLOGY AT NIST: CRITICAL MEASUREMENTS, DATA AND STANDARDS FOR AN EMERGING INDUSTRY.
NCSLWorkshop & Symposium 2000, Toronto, Ontario, Canada, 7/17.

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ANNOUNCEMENTS

2000 U.S. WORLD STANDARDS DAY PAPER COMPETITION
This year, the U.S. standards community will celebrate World Standards Day on October 18, 2000. To highlight the importance of standards to industry and government, the sponsors of World Standards Day, including NIST, are again holding a paper competition. The theme for the 2000 World Standards Day paper contest will be "Standards for Change and Stability." PRIZES: The author(s) of the winning submission will receive $2,500 and a commemorative plaque. Prizes of $1000 for 2nd place and $500 for third place may also be awarded. Winning papers will be published by the Standards Engineering Society, ANSI, and others. ELIGIBILITY: The competition is open to individuals in private sector or government facilities. The paper may be co-authored. RULES: The paper must be original and not previously published. NIST papers should be processed through WERB or BERB in the usual way. Entries must be received by August 27, 2000. Contest rules and application forms may be obtained through the Standards Engineering Society home page at http://www.ses-standards.org or call Glenn Ziegenfuss, Executive Director, SES, 305-971-4798.
NIST Contact: Ellen Trager, 301-975-4038, ellen.trager@nist.gov

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NIST WEB SITE ANNOUNCEMENTS

No Web Site announcements this week.

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For more information, contact Ms. Sharon Mingo, Editor, Stop 2500, National Institute of Standards and Technology, Gaithersburg MD 20899-2500; Telephone: 301-975-TCAL (8225); Fax: 301-926-4431; or Email: tcal@nist.gov.

All lectures and meetings are open unless otherwise stated.

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