Polymeric Building Materials Group

Instrumentation

---

Instrumentation on this page:

Advanced UV Exposure Apparatus Automated High Throughput Analysis Table Static Stress Instrument Automated Sealant Testing Apparatus Mechanical Testing Fourier Transform Infrared (FTIR) Spectrometer Relative Humidity Generator Nanoscale and Microscale Characterization Analytical Instrumentation Other Instruments

High Throughput Testing and Analysis

Advanced UV Exposure Apparatus

NIST 2 M Integrating Sphere High level of irradiance and irradiance uniformity High intensity UV output Contains all relevant wavelengths in the solar spectrum Precise humidity and temperature control Capacity for in-situ loading More information: http://slp.nist.gov Advanced Solar Simulator 1000 watt Xenon Arc source Humidity and temperature controlled environment XYZ controller for measuring intensity with UV-Vis spectrometer Local contact: Dr. Joannie Chin, joannie.chin@nist.gov

Automated High Throughput Analysis Table

FTIR with ATR probe UV-Vis spectrometer with Integrating Sphere Innovative multi-sample positioning table. Completely automated sample tracking and data acquisitioning system Automated analysis of Dose, Damage, Gloss, and Color Polymer coatings and films Local contact: Dr. Christopher C. White, christopher.white@nist.gov

Static Stress Instrument

Used to test composite durability with resin-impregnated fiber tows Array of 36 samples tested at one time Maximum load 180 lb Pneumatic loading Temperature and humidity control   Local contact: Dr. Joannie Chin, joannie.chin@nist.gov

Automated Sealant Testing Apparatus

Unique five ASTM C719 sample testing frame Both compression and extension 1500 lb loading capacity 100 nm positional accuracy Automated cyclic testing of ASTM C719 joints Force-Displacement curves recorded for every cycle every sample Prototype for environmentally controlled sealant joint testing apparatus   Local contact: Dr. Christopher C. White, christopher.white@nist.gov.

Fourier Transform Infrared (FTIR) Spectrometers (2)

Motorized wafer sampler attachment Software to analyze thousands of spectra on the fly Interfaced to Thermal Gravimetric Analyzer (TGA) Variable angle attenuated total reflectance Variable angle specular reflectance attachments Horizontal attenuated total reflectance attachment Single reflection prism liquid cell attachment ZnSe polarizer Microscope Local contact: Mr. Walter Eric Byrd, walter.byrd@nist.gov

Relative Humidity Generator

Multi-processor control Provides control over multiple environments Temperature control range from 20 oC to 60 oC Temperature variability ± 1 oC. Relative humidity control range from 5 % RH to 95 % RH. Relative variability ± 2 % RH. Local contact: Mr. Edward (Ned) Embree, edward.embree@nist.gov

Nanoscale and Microscale Characterization

Nanoindenter

Surface mechanical property evaluation Quasi-static indentation testing Dynamic contact testing Continuous stiffness measurements Scratch testing Automated testing and analysis Local contact: Dr. Mark VanLandingham, mark.vanlandingham@nist.gov

Atomic Force Microscope

Multiple modes for imaging surface topography and heterogeneity Force curve measurements Nanoindentation of polymers 1 nm lateral resolution, sub-nm vertical resolution Patented small volume environment chambers Chemically modified probe tips More information: http://ciks.cbt.nist.gov/markv/ Local contact: Dr. Mark VanLandingham, mark.vanlandingham@nist.gov

Laser Scanning Confocal Microscope

Used to characterize surface topography and microstructure Non-destructive Three scanning laser wavelengths (543 nm, 488 nm, and 435 nm) High resolution (sub-mm) in the thickness or axial directions. Fluorescent measurement capability Local contact: Dr. Li-Piin Sung, lipiin@nist.gov

Automated Multi-Application Light Scattering Instrument

Static and dynamic Scattering and reflection Free films, coatings on substrates, wet films, and liquid High operating speed for scanning a large sample area 2D scattering profile for characterizing surface and substructure Real spatial imaging for texture and other pattern surfaces More information: http://slp.nist.gov Local contact: Dr. Li-Piin Sung, lipiin@nist.gov

Microtome

Used to section both large and small, hard and soft specimens Section thickness range is 1 mm to 999 mm Maximum specimen size 25 cm x 20 cm x 7 cm Variable cutting speeds and lengths of stroke Oriented motor drive specimen holder Ultramilling attachment Optional device available for cooling the specimen in liquid nitrogen Local contact: Mr. Walter Eric Byrd, walter.byrd@nist.gov

Mechanical Testing

Instron Mechanical Testing System

10 000 kg capacity Multiple load cells Displacement controlled (screw driven) Capabilities include peel testing, 3 pt. bend testing, and tensile testing Thermal chamber and liquid sample environment Computer control and data acquisition Mechanical and pneumatic grips Local contact: Dr. Tinh Nguyen, tinh.nguyen@nist.gov

Analytical Instrumentation

Moisture Analyzer

Controlled changes in relative humidity and temperature Full characterization of moisture diffusion Combines an ultra sensitive microbalance with precise measurement Automated Three measurement modes   Local contact: Mr. Walter Eric Byrd, walter.byrd@nist.gov

Lead Content Measurement Apparatus

Flame Atomic Absorption Spectrometer Graphite Furnace Atomic Absorption Spectrometer X-ray Fluorescence Anodic Stripping Voltammetry Local contact: Mr. Walter Eric Byrd, walter.byrd@nist.gov

Other analytical instruments in the Organic Building Materials Group:

• Dynamic Mechanical Analyzer (DMA): 3-point bending fixture; dual cantilever fixture; fiber & film fixture; shear sandwich fixture; parallel plate fixture.
• Thermal Gravimetric Analyzer (TGA): hi- resolution w/ autosampler; evolved gas analysis furnace to connect to Nicolet FTIR spectrometer.
• Modulated Differential Scanning Calorimeter (DSC) with DSC Refrigerated cooling system and DSC liquid Nitrogen cooling attachment.
• UV-Vis Spectrometer with fiber optics and motorized wafer sampler attachments.
• UV-Vis-NIR Spectrometer with 150mm integrating sphere
• Dew Point Hygrometers: Measures humidity to 0.2%RH; computer controlled rotary valve for monitoring humidity.
• Ion Analyzer / pH Meter with computer interface

Local contact: Mr. Walter Eric Byrd, walter.byrd@nist.gov

Privacy Policy/Security Notice/Accessability  |  Disclaimer  |  FOIA NIST is an agency of the U.S. Department of Commerce