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NIST Technicalendar
June 23 to June 27, 2008 The NIST Technicalendar is issued each Friday. All items MUST be submitted electronically from this web page by 12:00 NOON each Wednesday unless otherwise stated in the NIST Technicalendar. The address for online weekly editions of the NIST Technicalendar and NIST Administrative Calendar is: http://www.nist.gov/tcal/. |
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1:00 PM - Low-frequency dielectric properties of individual carbon nanotubesTUESDAY - 6/24
10:00 AM - CGS Interferometry for Characterization of Wafer Deformation and Thin Film StressWEDNESDAY - 6/25
10:30 AM - Hyperspectral Imaging Utilizing LCTF and DLP Technology for Surgical and Clinical Applications
10:30 AM - Magnetic and dielectric properties of complex oxide thin films and multilayers
10:30 AM - Research in ultra-cold atoms and superconducting Josephson junctions
10:00 AM - Nanoparticle Surface Chemistry-Physical Property Relationships: From Impedance-Based Virus Sensing to Conductive LubricantsTHURSDAY - 6/26
10:30 AM - Visible and Infrared Imaging Spectroscopy of Paintings
10:30 AM - Measuring Up the U.S. Measurement System (USMS)
10:00 AM - Light Induced Charge Transfer in Nanoparticles: Ag and TiO2FRIDAY - 6/27
12:00 PM - NCW brown bag - Improve your skills to negotiate and communicate
2:00 PM - Biomedical Imaging with X-ray & Bioluminescence
3:30 PM - Disease Signatures
10:00 AM - Fluorescence Correlation Spectroscopy: A Quantitative Technique to Investigate Biomacromolecular Interactions and Dynamics in Complex Media
1:30 PM - In Situ Exploring the Properties of Nanomaterials and Nanostructures inside a TEM