NIST Technicalendar May 19 to May 23, 2008 The NIST Technicalendar is issued each Friday. All items MUST be submitted electronically from this web page by 12:00 NOON each Wednesday unless otherwise stated in the NIST Technicalendar. The address for online weekly editions of the NIST Technicalendar and NIST Administrative Calendar is: http://www.nist.gov/tcal/.

In this Issue: Meetings at NIST Meetings Elsewhere Announcements Talks by NIST Personnel NIST Web Site Announcements NIST Administrative Calendar (current)   NIST Vacancy Announcements (current)

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10:45 AM - Methods for the resolution of completely co-eluting components in mass spectrometry data
11:00 AM - Electrical transport studies of nanoelectronic materials
4:00 PM - The Russian-American Gallium Solar Neutrino Experiment (SAGE)

10:45 AM - Separable nonlinear models for spectroscopy, microscopy and mass spectrometry data
3:00 PM - Near Best Rational Approximation and Spectral Methods

10:30 AM - Using Sequential Importance Sampling to Speed up MCMC
11:00 AM - Hyperthermia Induction Modeling for Optically-Active Nanoparticles

10:30 AM - Surface Plasmon Resonance Imaging for the Label-free Mapping of Near-field Transport Properties

No Scheduled Events

5/19 -- MONDAY

10:45 AM - STATISTICAL ENGINEERING DIVISION SEMINAR: Methods for the resolution of completely co-eluting components in mass spectrometry data
Mass spectrometry data typically represent the superposition of the contribution of many distinct chemical compounds, most often resolved with respect to both time and mass-to-charge ratio. Estimation of the mass spectra and elution profiles of individual compounds from the superposition data is termed component resolution or deconvolution, and is especially challenging if several compounds co-elute, that is, have similar profiles in time. When the elution profiles of two or more compounds are completely co-eluting, component resolution is only possible via the simultaneous analysis of data representing different samples in which the amplitudes of the completely co-eluting compounds differ. To date, multivariate curve resolution alternating least squares (MCR-ALS) is the only method developed for component resolution for the case of completely co-eluting compounds in mass spectrometry data. In this talk I present a newly developed alternative methodology, global analysis, which is based on a parametric model for the elution profiles. Global analysis can be shown to have better performance than MCR-ALS in terms of the estimated mass spectra for problems involving completely co-eluting components, which I will illustrate with results from a comparative study on simulated GC mass spectrometry datasets.
Katharine Mullen , Department of Physics and Astronomy, Vrije Universiteit Amsterdam.
Building 222, Rm. A330. (NIST Contact: Charles Hagwood, 301-975-2846, hagwood@nist.gov)

11:00 AM - SEMICONDUCTOR ELECTRONICS DIVISION SEMINAR: Electrical transport studies of nanoelectronic materials
Aaron Trionfi , Sandia National Laboratories.
225 Bldg, Rm. A362. (NIST Contact: Curt Richter, 301-975-2082, curt.richter@nist.gvo)

4:00 PM - IONIZING RADIATION DIVISION SEMINAR: The Russian-American Gallium Solar Neutrino Experiment (SAGE)
The radiochemical solar neutrino experiments using ultrapure gallium have a great impact upon the current view of neutrino oscillations. SAGE is currently the only operating solar neutrino experiment that provides the determination of the fundamental neutrino flux from proton-proton fusion, the dominant reaction powering the sun. Current results of the solar neutrino measurement and results of a source neutrino experiment on the gallium detector are discussed.
Vladimir Gavrin , Institute for Nuclear Research - Russian Academy of Sciences.
Bldg. 245, Rm. C301. (NIST Contact: Jeff Nico, 301-975-4663, jnico@nist.gov)


5/20 -- TUESDAY

10:45 AM - STATISTICAL ENGINEERING DIVISION SEMINAR: Separable nonlinear models for spectroscopy, microscopy and mass spectrometry data
Models consisting of a linear superposition of non-linear functions with a Gaussian distributed noise term are used to describe data arising in a wide variety of applications. The inverse problem associated with estimating the most likely values for the linear and nonlinear parameters of such a model is an instance of separable nonlinear least squares, which is possible to address with the variable projection algorithm due to Golub and Pereyra and variants thereof. The rapid and accurate solution of separable nonlinear least squares problems has become increasingly important in the physical sciences, as improvements in instrumentation have made data resolved with respect to many experimental variables more common. Multi-way data is often possible to describe in selected experimental variables in terms of a nonlinear parametric model, while in other experimental variables a parametric description may be not feasible or desirable. In such situations a separable nonlinear model may be used to describe the data in all experimental variables simultaneously. In this talk I will discuss applications of separable nonlinear models in time-resolved fluorescence microscopy of cells in vivo, as well as in ultra-fast time-resolved spectroscopy and mass spectrometry. I will also discuss the implementation of a framework for the specification and optimization of separable nonlinear models in the R package TIMP for the R language and environment for statistical computing.
Katharine Mullen , Department of Physics and Astronomy, Vrije Universiteit Amsterdam.
Building 222, Rm. A330. (NIST Contact: Charles Hagwood, 301-975-2846, hagwood@nist.gov)

3:00 PM - MATHEMATICAL AND COMPUTATIONAL SCIENCES DIVISION SEMINAR: Near Best Rational Approximation and Spectral Methods
Joris Van Deun , University of Antwerp, Belgium.
Administration Bldg, Lecture Rm. F. (NIST Contact: Daniel Lozier, 301-975-2706, daniel.lozier@nist.gov) http://math.nist.gov/mcsd/Seminars/2008/2008-05-20-VanDeun.html


5/21 -- WEDNESDAY

10:30 AM - STATISTICAL ENGINEERING DIVISION SEMINAR: Using Sequential Importance Sampling to Speed up MCMC
The Monte Carlo Markov Chain Method (MCMC) has been written about extensively and there is an extensive theory developed. But getting answers to problems is still difficult because MCMC can be slow. We present two methods for speeding up MCMC for the monomer-dimer problem based on the method of sequential importance sampling (SIS). Our method computes optimal fugacities. The other computes the mixing rate efficiently.
Isabel Beichl , Mathematical and Computational Sciences Division/NIST.
Building 222, Rm. A330. (NIST Contact: Charles Hagwood, 301-975-2846, hagwood@nist.gov)

11:00 AM - MATERIALS SCIENCE AND ENGINEERING LABORATORY LECTURE SERIES: Hyperthermia Induction Modeling for Optically-Active Nanoparticles
Optical activation of gold-nanoshell particles with laser radiation in the near-infrared spectrum provides a means to induce hyperthermia in a tumor while leaving the surrounding healthy tissue intact. The procedure entails two processes: (i) heating of the nanoshells via a plasmon resonance phenomenon and (ii) diffusion of the heat from the particles into the surrounding tissue. Both processes are influenced by the density and distribution of particles within the tumor. Additionally, tumor-scale modeling of thermal ablation efficacy requires effective properties of tissue containing particles. Little is known about these effective properties. Moreover, while the dependence of plasmon resonance absorption on shell size and thickness is well documented, the dependence of plasmon resonance heating on nanoshell density and shell defects is not as clear. Mesoscale computer simulations are used to elucidate these two processes and to determine effective system properties and responses of nanoshell particle ensembles.
Edwin Fuller, Jr. , Physicist, Ceramics Division, edwin.fuller@nist.gov.
Administration Bldg, Green Auditorium. (NIST Contact: Bill Boettinger, 301-975-6160, william.boettinger@nist.gov)


5/22 -- THURSDAY

10:30 AM - BIOPHYSICS GROUP SEMINAR: Surface Plasmon Resonance Imaging for the Label-free Mapping of Near-field Transport Properties
A label-free visualization technique based on surface plasmon resonance (SPR) reflectance sensing is presented for real-time and full-field mapping of microscale concentration and temperature profiles. The key idea is that the SPR reflectance sensitivity varies with the refractive index of the near-wall region of the test mixture fluid. The Fresnel equation, based on Kretschmann's theory, correlates the SPR reflectance with the refractive index of the test medium, and then, the refractive index correlates with the mixture concentration or temperature. The basic operation principle is that when noble metal is illuminated by p-polarized light or electron at specific angle above critical angle, evanescent wave is generated to excite surface plasmon (SP) wave in the interface between the thin noble metal film and test medium. The surface plasmon wave is highly sensitive to the variation of refractive index of test medium with an accuracy of 10-9 in RIU to provide a powerful tool for chemical/bio sensing. The existing SPR related techniques, however, are effectively point-wise, and mostly lack of systematic, quantitative approach. In this study, surface Plasmon resonance (SPR) is firstly applied and demonstrated to detect near-field microfluidic properties such as concentrations and temperatures in label-free, real-time, and full-field manner using a laboratory-developed SPR reflectance imaging system. Three example applications are presented: (1) micromixing concentration field development of ethanol penetrating into water contained in a micro-channel, (2) full-field detection of the near-wall salinity profiles for convective/diffusion of saline droplet into water, and (3) SPR imaging thermometry of cooling of hot water droplet in air and cold water medium as well as parametric study of optical properties. Also presented are discussions on the measurement sensitivity, uncertainties, parametric study of optical properties such as refractive indices of prism and thin metal film, and detection limitations of the implemented SPR imaging sensor. Furthermore, SPR reflectance imaging can be effectively applied in the bio-chemical sensing field such as interactions between cell and substrate because of its high sensitivity in the near surface less than 1 ?m, and SPR can be coupled with nanoparticles to present various applications including nanomedicine.
Iltai Kim , Department of Mechanical, Aerospace & Biomedical Engineering, University of Tennessee, Knoxville, TN, itkimbrian@utk.edu.
AML Bldg, Rm. H107. (NIST Contact: Jeeseong Hwang, 301-975-4580, jeeseong.hwang@nist.gov)


5/23 -- FRIDAY

No Scheduled Events

ADVANCE NOTICE

5/30/08 2:00 PM - FIRE RESEARCH DIVISION SEMINAR: A One-Dimensional Stochastic Model of Multi-Scale Dynamics in Turbulent Flow
One computational strategy for capturing micro-scale processes not affordably resolved in multi-dimensional turbulence simulations is to represent these processes by a lower-dimensional formulation. An approach formulated in one spatial dimension, denoted One-Dimensional Turbulence (ODT), is outlined. ODT combines two 1D approaches that have individually proven successful: stochastic iterated maps and dimensional reduction of the governing equations using the boundary-layer approximation. Within ODT, sub-processes based on these two approaches are coupled so as to represent both turbulent cascade dynamics and micro-physics at dissipative scales, with strong two-way interaction. Model performance is illustrated by applications to representative shear-driven and buoyancy-driven turbulent flows, with emphasis on micro-scale couplings. A recent application to soot-radiation-turbulence coupling in fires is highlighted. Progress on implementation of ODT as a sub-grid closure for 3D flow simulation is described.
Alan Kerstein , Combustion Research Facility - Sandia National Laboratories, Livermore, CA.
Bldg 224, Rm B245. (NIST Contact: Rodney Bryant, 301-975-6487, rbryant@nist.gov)

6/3/08 9:00 AM - COMPUTER SECURITY DIVISION SEMINAR: Applications of Pairing-Based Cryptography: Identity-Based Encryption and Beyond
This workshop brings together academia, government and industry to explore innovative and practical applications of pairing-based cryptography. Pairings have been used to create identity-based encryption schemes, but are also a useful tool for solving other cryptographic problems. We hope to encourage the development of new security applications and communication between researchers, developers and users.
Keynote I: Matt Franklin, University of California, Davis , "An Introduction to Identity Based Encryption". Keynote II: Brent Waters, SRI , "Functional Encryption: Beyond Public Key Cryptography". A complete program of all presentations and panels can be found at the workshop website.
Administration Bldg, Green Auditorium. (NIST Contact: Sara Caswell, 301-975-4634, sara@nist.gov) http://www.nist.gov/ibe/

6/3/08 1:30 PM - CNST NANOFABRICATION RESEARCH GROUP SEMINAR: Terahertz Optoelectronics: New Devices, Techniques, and Applications
The terahertz (THz) spectral range has traditionally been referred to as the gap in the electromagnetic spectrum. While there has been recent success in developing sources and detectors, there has been little work in the developing device technologies. The use of plasmonics, which refers to surface excitations at metal-dielectric interfaces, is aggressively being pursued to develop the requisite capabilities. This approach offers several attractive features such as the possibility for a simplified device topology, subwavelength field localization, and low-loss transmission of THz radiation. I will describe my work in understanding the properties of surface plasmons at THz frequencies and its relevance to developing unique and useful THz optoelectronic devices.
Amit Agrawal , University of Utah, Salt Lake City, UT,.
Bldg. 217, Rm. H107. (NIST Contact: Henri Lezec, 301-975-8612, henri.lezec@nist.gov)

6/5/08 10:30 AM - CNST NANOFABRICATION RESEARCH GROUP SEMINAR: The Physics of Surface Waves at the Metal-Dielectric Interface Interacting with Structures of Subwavelength Scale
The localization, enhanced transport, and transmission of light along and through subwavelength structures holds promise for chip-scale photonic circuit integration, biological sensors, and dense optical storage media. The basic physics of this transport and transmission has been, however, imperfectly understood and attempts to rationalize early experimental results from the perspectives of crystal periodicity, classical physical optics, diffraction, and classical electrodynamics have led to diverse and often conflicting interpretations and predictions. We present here a series of studies seeking to explain the fundamental physics of a single propagating mode interacting with a single subwavelength structure and how this physics relates to transport and transmission through periodic arrays of such structures.
John Weiner , Professor.
Bldg. 217, Rm. H107. (NIST Contact: Henri Lezec, 301-975-8612, henri.lezec@nist.gov)

6/6/08 10:30 AM - NIST COLLOQUIUM SERIES: Observing Climate with Satellites: Are We on Thin Ice?
(Rescheduled from April 11, 2008) The Earth's climate is determined by irradiance from the Sun and by properties of the atmosphere, oceans, and land that determine the reflection, absorption, and emission of energy within our atmosphere and at the Earth's surface. Since the 1970s, Earth-viewing satellites have complemented non-satellite geophysical information and led to an unprecedented understanding of the Earth's coupled ocean-land-atmosphere system. I will describe the Earth's climate system, as understood from data from earth-viewing satellites and ground-based geophysical monitoring stations, review arguments against global warming, and show the unprecedented convergence of evidence for global warming in the past few years. I will also discuss recent concerns about warming-induced instabilities to the ice sheets of Greenland and Antarctica
Compton Tucker , Goddard Fellow, NASA Goddard Space Flight Center.
Administration Building, Green Auditorium. (NIST Contact: Kum Ham, 301-975-4203, kham@nist.gov)
Special Assistance Available

6/11/08 10:30 AM - CNST NANOTECHNOLOGY SEMINAR SERIES: GATED CARBON ELECTRONICS
We discuss techniques for making gated nanoelectronics based on carbon nanotubes and graphene, and some of the new physics and possible applications that is available in these systems. Here we will focus on few-electron quantum dots in nanotubes -- possibly for application to quantum information -- and p-n junctions in graphene.
Prof. Charles Marcus , Harvard University,.
Bldg. 215, Rm. C103-C106. (NIST Contact: Nikolai Zhitenev, 301-975-6039, nikolai.zhitenev@nist.gov)

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MEETINGS ELSEWHERE


5/19 -- MONDAY

11:00 AM - CARNEGIE INSTITUTION OF WASHINGTON/GEOPHYSICAL LAB. SEMINAR: NON-TRADITIONAL APPLICATIONS OF STABLE ISOTOPES: BUGS TO STARS
E. Young , Univ. of California, Los Angeles, CA.
Bldg, Rm..
Greenewalt Bldg., GL-DTM Grounds, Carnegie Institution of Washington, DC. (NIST Contact: R. Hemley, 202-478-8900, seminar@lists.ciw.edu)



5/20 -- TUESDAY

No Scheduled Events

5/21 -- WEDNESDAY

No Scheduled Events

5/22 -- THURSDAY

11:00 AM - CARNEGIE INSTITUTION OF WASHINGTON/GEOPHYSICAL LAB. SEMINAR: INVESTIGATING PLANETARY CORES WITH PHOTONS
J. Li , Univ. of Illinois, Urbana-Champaign.
Bldg, Rm..
Greenewalt Bldg., GL-DTM Grounds, Carnegie Institution of Washington, DC. (NIST Contact: R. Hemley, 202-478-8900, seminar@lists.ciw.edu)



5/23 -- FRIDAY

No Scheduled Events

ADVANCE NOTICE

No Scheduled Events

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TALKS BY NIST PERSONNEL

GAITAN, M. : MEMS STANDARDIZATION.
Metric 2008, MEMS Industry Group, Pittsburgh, Pennsylvania, 5/8.

SHULL, R. : MAGNETIC MOMENT AND SUSCEPTIBILITY CALIBRATION STANDARDS.
2008 Magnetics Conference, Hyatt Regency Denver Tech Center, Denver, CO, 5/15.

NGUYEN, N. : INTERFACE BARRIER DETERMINATION BY INTERNAL PHOTOEMISSION: APPLICATIONS TO METAL/OXIDE/SEMICONDUCTOR STRUCTURE.
Invited Talk, Electrochemical Society 213th Meeting, Phoenix, Arizona, 5/18.

SIMMON, E. : IMPROVING ENVIRONMENTAL INFORMATION HANDLING AND DATA EXCHANGE WITHIN THE ELECTRONICS INDUSTRY.
2008 IEEE International Symposium on Electronics and the Environment, San Francisco, USA, 5/19.

DELONGCHAMP, D. : THE IMPACT OF THE DIELECTRIC/SEMICONDUCTOR INTERFACE ON MICROSTRUCTURE AND CHARGE CARRIER TRANSPORT IN HIGH-PERFORMANCE POLYTHIOPHENE TRANSISTORS.
Electrochemical Society Meeting, Phoenix, AZ, 5/20.

KARIM, A. : CHARACTERIZATION METHODS FOR NANOPARTICLES FOR BIOSYSTEMS.
American Chemical Society Mid-Atlantic Meeting, New York, NY, 5/20.

KARIM, A. : TEMPLATED ASSEMBLY OF BLOCK COPOLYMERS.
American Chemical Society Mid-Atlantic Meeting, New York, NY, 5/20.

KOPANSKI, J. (Co-Author: T.Walker , Pennsylvannia State University) : SCANNING PROBE MICROSCOPY FOR DIELECTRIC AND METAL CHARACTERIZATION.
213th Electrochemical Society Meeting, Phoenix Convention Center, Phoenix, AZ, 5/20.

MCDONOUGH, W. : THE ROLE OF FOLDING IN THE DEGRADATION OF BALLISTIC FIBERS.
SAMPE 08 Conference, Long Beach, CA, 5/21.

SUEHLE, J. : CURRENT NOISE AS A TOOL FOR THE ELECTRICAL AND RELIABILITY CHARACTERIZATION OF NANOELECTRONIC MATERIALS AND DEVICES.
Electrical Engineering Dept., University of Notre Dame, University of Notre Dame, Notre Dame, IN, 5/21.

WU, W. : FUNDAMENTALS OF X-RAY SCATTERING AND ITS APPLICATION TO NANOSTRUCTURE.
Universityof California, Irvine, Los Angeles, CA, 5/22.

WU, W. : CHALLENGES IN TODAY'S PHOTORESIST FOR 45 NM RESOLUTION AND BEYOND.
University of California, Irvine, Los Angeles, CA, 5/23.

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ANNOUNCEMENTS

PLEASE JOIN NCSCI FOR STANDARDS INFORMATION DAY -- TUESDAY, MAY 20
NCSCI: Bldg. 222, Room B107 -- 2-4 p.m. Did you know there is a standard for ... · Capturing criminal mugshots? · Installing a laser at home? · Slipperiness in bathtubs? If you use standards in your work, need research assistance for standards, access to standards, or support in your standards committee work, visit NCSCI and learn all about our standards services. There will also be Refreshments, Prizes, and more Fun than usual. NCSCI is your source for standards information at NIST! Please note: Non-NIST guests must make prior arrangements to attend. Please call 301-975-4040 or email ncsci@nist.gov. Thank you.
NIST Contact: Anne Meininger, 301-975-2921, anne.meininger@nist.gov

NIST CELEBRATION - "METROLOGY FOR THE OLYMPIC GAMES" - MAY 20TH
World Metrology Day - May 20th, 1:30 pm to 4:00 pm, Green Auditorium and NIST Research Library Metrology in Sports is the theme for this year's World Metrology Day. The International Bureau of Weights and Measures (BIPM) has designated World Metrology Day to commemorate the signing of the Treaty of the Meter in 1875. NIST will hold its second annual celebration on May 20th from 1:30 pm to 4 pm in the Green Auditorium and the Research Library. NIST's theme this year will focus on "Metrology for the Olympic Games." We will have special guest speakers Victoria Ivanova, from the World Anti-Doping Agency, WADA and Lindsey Mackay from the National Metrology Institute of Australia. Introduction and Welcome – Rich Kayser Overview of World Metrology Day – Belinda Collins (TS) Introduction of Speakers – Willie E. May (CSTL) "An Overview of WADA activities and WADA Proficiency Testing Program" – Victoria Ivanova, Scientific Project Manager, World Anti-Doping Agency, Montreal Canada "Certified Reference Materials for Sports Testing" – Lindsey Mackay, Team Leader, Chemical Reference Methods, Chemical & Biological Metrology Branch, National Measurement Institute, Department of Innovation, Industry, Science and Research, Australia Close & Invitation to Reception & Posters/Displays in the NIST Research Library See this website for more information about WADA, its history, and current activities: http://www.wada-ama.org/en/. Please note: Non-NIST guests must make prior arrangements to attend. Please call 301-975-4500 or email sandra.auchmoody@nist.gov.
NIST Contact: Belinda Collins, 301-975-4500, belinda.collins@nist.gov

ANNUAL NRC VISIT FOR THE NIST NRC POSTDOCTORAL PROGRAMS
On Thursday, May 22, 2008 the National Research Council Postdoctoral Research Associateship Programs Staff will be visiting NIST Gaithersburg to discuss the NIST-NRC Postdoc Program. The visit will take place in the Administration Building, Lecture Room C at 11:00 a.m. The NRC Staff welcomes a discussion with NIST Postdoc Advisors, Supervisors, Managers and other interested parties. Please pass this information on to all interested parties in your OU. This is NIST's opportunity to ask about the NIST/NRC Postdoctoral Research Associateship Program and we encourage broad participation in the 11:00 a.m. session. NRC Participants include: Dr. Ray Gamble, Program Director, Postdoctoral Research Associateship Programs and Ms. Sally Lytch, Postdoctoral Research Associateship Programs PLEASE NOTE: For Boulder Staff, there will be a separate session in Boulder on June 19, 2008.
NIST Contact: Susan Heller-Zeisler, 301-975-3111, szeisler@nist.gov

CROSS INDUSTRY ISSUES IN NANOMANUFACTURING
The National Institute of Standards and Technology is hosting a "Cross Industry Issues in Nanomanufacturing" Workshop, May 20 - 22, 2008 at NIST in Gaithersburg. The objective of the workshop is to identify common problems and common solutions specific to nanotechnology, manufacturing processes, and performance of nanomaterials in commercial products within widely different industries, including aerospace, automotive, chemical, food, forest products, medical technology, pharmaceutical, and semiconductor. The technical focus will be on the three highest cross-industry priorities identified in previous workshops and meetings as they apply to the design, synthesis, and production of nanotechnology-enabled products: -Characterizing nanomaterials and enhancing their separation and fractionation to address challenges in commercial production of uniform, high quality, stable, and consistent (reproducible) nanomaterials in high volume; -Understanding and controlling the surface-dependent properties of nanomaterials such as dispersion, aggregation, and adhesion at their interface with a matrix, with an emphasis on non-covalent bonding interactions; and -Understanding and controlling multiple properties of nanocomposites. Within each of these topics, common issues include, although are not limited to, measurement, characterization, modeling, performance properties, and environment health and safety concerns. Resource speakers will present needs as viewed by industry, with participation by all who attend. The workshop is sponsored by NIST, the American Forest and Paper Association, the University of Maryland Department of Materials Science and Engineering, Imerys, US Forest Service, and endorsed by the Nanoscale Science, Engineering, and Technology Subcommittee of the National Nanotechnology Initiative in collaboration with the Nanomanufacturing Industry Liason and Innovation Working Group.
NIST Contact: Anne Chaka, 301-975-2481, anne.chaka@nist.gov

RADIATION THERMOMETRY SHORT COURSE
Sponsored by the Optical Technology Division at NIST and Space Dynamics Laboratory at Utah State University, the Radiation Thermometry Short Course is designed for scientists, engineers, and technicians who need to make reliable temperature measurements using radiation thermometers. The course will consist of lectures and skill-building, problem-solving laboratory experiments and will cover the fundamentals of radiometric physics and instrumentation associated with determining temperature from observations of thermal radiation from materials. The exercises will provide experience in performing radiometric analyses to internalize key concepts and to serve as preparatory work for the experiments.
NIST Contact: Benjamin Tsai, 301-975-2347, tsai@nist.gov

VISITOR REGISTRATION FOR NIST EVENTS
Because of heightened security at the NIST Gaithersburg site, members of the public who wish to attend meetings, seminars, lectures, etc. must first register in advance. For more information please call or e-mail the "NIST Contact" for the particular event you would like to attend.
NIST Contact: . ., ., .

2008 WORLD STANDARDS DAY PAPER COMPETITION
The U.S. standards community will celebrate World Standards Day on Thursday, October 23, 2008, at the Ronald Reagan Building and International Trade Center in Washington, DC. The theme for this year's celebration, "Intelligent and Sustainable Buildings," recognizes the critical role of standards and conformity assessment programs in ensuring safety requirements; facilitating coordination among contractors, builders, engineers, and architects; and incorporating new technologies in design and construction. In conjunction with this year's event, the 2008 World Standards Day sponsors, including NIST will hold the annual paper competition. The 2008 World Standards Day Paper Competition invites papers that use specific examples to show ways that standards and conformity assessment programs are used for intelligent and sustainable buildings. Paper competition winners will be announced and given their awards at the US celebration of World Standards Day. The first place winner will receive a plaque and $2,500. Second and third place winners will receive $1,000 and $500, respectively, along with a certificate. In addition, the winning papers will be published in SES's journal, "Standards Engineering." ELIGIBILITY: The competition is open to U.S.-based individuals in the private sector, government, or academia. Papers may be co-authored. RULES: Entries must be original and not previously published. NIST papers must be processed through WERB or BERB. All paper contest submissions must be received with an official entry form by midnight on August 29, 2008, by the SES Executive Director, 13340 SW 96th Avenue, Miami, Florida, 33176. Complete details and official entry forms are available on the SES website www.ses-standards.org (follow the link for "2008 WSD Paper Competition.") For additional information about the U.S. Celebration of World Standards Day, or to register for the event, please visit www.wsd-us.org.
NIST Contact: Mary Donaldson, 301-975-6197, mary.donaldson@nist.gov

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NIST WEB SITE ANNOUNCEMENTS

No Web Site announcements this week.

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For more information, contact Ms. Sharon Hallman, Editor, Stop 2500, National Institute of Standards and Technology, Gaithersburg MD 20899-2500; Telephone: 301-975-TCAL (3570); Fax: 301-926-4431; or Email: tcal@nist.gov.

All lectures and meetings are open unless otherwise stated.

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