X20C Publications


Calendar Year
Total Pubs
Premier Pubs *
2008
5
1
2007
15
5
2006
13
1
2005
5
0
2004
11
3
2003
14
2
2002
23
1
2001
19
2
2000
4
0
1999
9
0


  1. W Knaepen, C Detavernier, R Van Meirhaeghe, J Jordan-Sweet, C Lavoie, In-Situ X-ray Diffraction Study of Metal Induced Crystallization of Amorphous Silicon, Thin Solid Films, 516(15), 4946-4952 (2008).
  2. P Besser, C Lavoie, C Murray, C D'Emic, K Ohuchi, Silicides for 22nm and Beyond, 213th Electrochemical Society Meeting, ECS Transactions, Vol 13, p. 377-388, sponsored by The Electrochemical Society (2008).
  3. S Raoux, J Jordan-Sweet, A Kellock, Crystallization Properties of Ultrathin Phase Change Films, J. Appl. Phys., 103(11), 114310 (2008).
  4. C Cabral, L Krusin-Elbaum, J Bruley, S Raoux, V Deline, A Madan, T Pinto, Direct evidence for abrupt postcrystallization germanium precipitation in thin phase-change films of Sb-15 at. % Ge, Appl. Phys. Lett., 93, 071906 (2008).[ premier ]
  5. M Ramazanoglu, S Larochelle, C Garland, R Birgeneau, High-Resolution X-ray Study of Nematic–Smectic-A and Smectic-A–Reentrant-Nematic Transitions in Liquid-Crystal–Aerosil Gels, Phys Rev. E: Stat. Phys., Plasmas, Fluids, 77, 031702 (2008).
  6. M Ramazanoglu, Phase Transitions in Liquid Crystal + Aerosil Gels, Ph.D Thesis. University of Toronto, Toronto (2007).
  7. B Sepiol, K Ludwig, Alloy Physics A Comprehensive Reference (2007).
  8. K Opsomer, D Deduytsche, C Detaveriner, R Van Meirhaeghe, A Lauwers , K Maex, C Lavoie, Influence of Ge Substrate Crystallinity on Co Germanide Formation in Solid-State Reactions, Appl. Phys. Lett., 90(3), 031906 (2007).[ premier ]
  9. W Leroy, C Detavernier, R Van Meirhaeghe, C Lavoie, Thin Film Solid-State Reactions Forming Carbides as Contact Materials for Carbon-Containing Semiconductors, J. Appl. Phys., 101, 053714 (2007).
  10. S Raoux, M Salinga, J Jordan-Sweet, A Kellock, Effect of Al and Cu Doping on the Crystallization Properties of the Phase Change Materials SbTe and GeSb, J. Appl. Phys., 101, 044909 (2007).
  11. D Milliron, S Raoux, R Shelby, J Jordan-Sweet, Solution-Phase Deposition and Nanopattering of GeSbSe Phase-Change Materials, Nat. Mater., 6, 352-356 (2007).[ premier ]
  12. Y Zhang, H Wong, S Raoux, J Cha, C Rettner, L Krupp, T Topuria, D Milliron, P Rice, J Jordan-Sweet, Phase Change Nanodot Arrays Fabricated Using a Self-Assembly Diblock Copolymer Approach, Appl. Phys. Lett., 91, 13104 (2007).[ premier ]
  13. M Ramazanoglu, S Larochelle, C Garland, R Birgeneau, High-Resolution X-ray Scattering Study of the Effect of Quenched Random Disorder on the Nematic-Smectic-A Transition, Phys Rev. E: Stat. Phys., Plasmas, Fluids, 75, 061705 (2007).
  14. S Raoux, Y Zhang, D Milliron, J Cha, M Caldwell, C Rettner, J Jordan-Sweet, H Wong, X-ray diffraction studies of the crystallization of phase change nanoparticles produced by self-assmbly-based techniques, European Phase Change and Ovonic Science Symposiym, p. F01, sponsored by OC Oerlikon Balzers (2007).
  15. C Torregiani, C Van Bockstael, C Detavernier, C Lavoie, A Lauwers, K Maex, J Kittl, Stress Evolution During Ni-Si Compound Formation for Fully Silicided (FUSI) Gates, Microelectron. Eng., 84, 2533-2536 (2007).
  16. J Kittl, M Pawlak, C Torregiani, A Lauwers, C Demeurisse, C Vrancken, P Absil, S Biesemans, C Coia, et. al., Transient and End Silicide Phase Formation in Thin Film Ni/polycrystalline-Si Reactions for Fully Silicided Gate Applications, Appl. Phys. Lett., 91(17), 172108 (2007).[ premier ]
  17. P Besser, C Lavoie, A Ozcan, C Murray, J Strane, K Wong, M Gribelyuk, Y Wang, C Parks, J Jordan-Sweet, Ni-Pt Silicide Formation Through Ti Mediating Layers, Microelectron. Eng., 84(11), 2511-2516 (2007).
  18. J Kittl, M Pawlak, C Torregiani, A Lauwers, C Demeurisse, C Vrancken, P Absil, S Biesemens, C Detavernier, et al., Kinetics of Ni3Si2 Formation in the Ni2Si-NiSi Thin Film Reaction from in situ Measurements, Appl. Phys. Lett., 91, 232102 (2007).[ premier ]
  19. Q Huang, A Kellock, S Raoux, Electrodeposition of SbTe Phase-Change Alloys, J. Electrochem. Soc., 155(2), D104-D109 (2007).
  20. S Raoux, C Rettner, J Jordan-Sweet, A Kellock, T Topuria, P Rice, D Miller, Direct Observation of Amorphous to Crystalline Phase Transitions in Nano-Particle Arrays of Phase Change Materials, J. Appl. Phys., 102, 094305 (2007).
  21. C Detavernier, C Lavoie, Edge-to-Edge Matching in Thin Films, Metall. Mater. Trans. A, 37A(3A), 851 (2006).
  22. S Rhee, C Murray, P Besser, Effects of BEOL Stack on Thermal Mechanical Stress of Cu Lines, Materials, Technology and Reliability of Low-k Dielectrics and Copper Interconnects, Vol 914, p. 0914-F08-01 , sponsored by MRS (2006).
  23. S Raoux, C Rettner, J Jordan-Sweet, V Deline, J Philipp, H Lung, Scaling properties of phase change nanostructures and thin films, European Symposium on Phase Change and Ovonic Science, p. 127-134, sponsored by CEA, France (2006).
  24. Y Wang, A Ozcan, k Ludwig, A Bhattacharyya, T Moustakas, L Zhou, D Smith, Complex and Incommensurate Ordering in Al0.72Ga0.28N Thin Films, Appl. Phys. Lett., 88(18), 181915 (2006).[ premier ]
  25. S Gaudet, C Detarvernier, A Kellock, P Desjardins, C Lavoie, Thin Film Reaction of Transition Metals with Germanium, J. Vac. Sci. Technol., A, 24(3), 474-485 (2006).
  26. W Leroy, C Detavernier, R van Meirhaeghe, A Kellock, C Lavoie, Solid-State Formation of Titanium Carbide and Molybdenum Carbide as Contcts for Carbon-Containing Semiconductors, J. Appl. Phys., 99, 063704 (2006).
  27. S Gaudet, C Lavoie, C Detavernier, P Desjardins, Germanide Phase Formation and Texture, SiGe Technology and Device Meeting, 2006, ISTDM 2006, International, p. 18-19, sponsored by IEEE (2006).
  28. K Park, Y Sung, M Toney, Structural Effect of PtRu-WO3 Alloy Nanostructures on Methanol Electrooxidation, Electrochem. Commun., 8, 359-363 (2006).
  29. M Toney, E Marinero, J Hedstrom, Microstructural Origin of Orientation Ratio in Magnetic Recording Media, J. Appl. Phys., 99, 033907 (2006).
  30. D Mitzi, S Raoux, A Schrott, M Copel, A Kellock, J Jordan-Sweet, Solution-Based Processing of the Phase-Change Material KSb5S8, Chem. Mater., 18, 6278-6282 (2006).
  31. H Schubert, C Hill, Structure of ATP-Bound Human ATP:Cobalamin Adenosyltransferase, Biochemistry, 45, 15188-15196 (2006).
  32. C Lavoie, C Detavernier, C Cabral, Jr. , F d'Heurle, A Kellock, J Jordan-Sweet, J Harper, Effects of Additive Elements on the Phase Formation and Morphological Stability of Nickel Monosilicide Films, Microelectron. Eng., 83(11-12), 2042-2054 (2006).
  33. S Gaudet, C Detavernier, C Lavoie, P Desjardins, Reaction of Thin Ni Films with Ge: Phase Formation and Texture, J. Appl. Phys., 100, 034306 (2006).
  34. D Deduytsche, C Detavernier, R Van Meirhaeghe, C Lavoie, High-Temperature Degradation of NiSi Films: Agglomeration Versus NiSi2 Nucleation, J. Appl. Phys., 98(3), 33526 (2005).
  35. H Kim, C Detavenier, O van der Staten, S Rossnagel, A Kellock, D Park, Robust TaNx Diffusion Barrier for Cu-Interconnnect Technology with Subnanometer Thickness by Metal-Organic Plasma-Enhanced Atomic Layer Deposition, J. Appl. Phys., 98, 014308 (2005).
  36. S Raoux, C Rettner, J Jordan-Sweet, M Salinga, M Toney, Crystallization Behavior of Phase Change Nanostructures, European Symposium on Phase Change and Ovonic Science, p. 14, sponsored by Plasmon (2005).
  37. T Thomson, S Lee, M Toney, C Dewhurst, Y Ogrin, C Oates, S Sun, Agglomeration and Sintering in Annealed FePt Nanoparticle Assemblies Studied by Small Angle Neutron Scattering and X-ray Diffraction, Phys. Rev. B: Condens. Matter, 72, 064441 (2005).
  38. J Jordan-Sweet, C Detavernier, C Lavoie, P Mooney, M Toney, Applications of Synchrotron X-rays in Microelectronics Industry Research, Nucl. Instrum. Meth. B, 241(1-4), 247-252 (2005).
  39. C Detavernier, C Lavoie, F d'Heurle, H Bender, R VanMeirhaeghe, Low-temperature Formation of CoSi2 in the Presence of Au, J. Appl. Phys., 95(10), 5340-5346 (2004).
  40. S Fritz, S Martin, C Frisbie, M Ward, M Toney, Structural Characterization of a Pentacene Monolayer on an Amorphous SiO2 Substrate with Grazing Incidence X-ray Diffraction, J. Am. Chem. Soc., 126, 4084-4085 (2004).[ premier ]
  41. H Kim, C Lavoie, M Copel, V Narayanan, D Park, S Rossnagel, The Physical Properties of Cubic Plasma-Enhanced Atomic Layer Deposition TaN Films, J. Appl. Phys., 95(10), 5848 (2004).
  42. A Ozcan, K Ludwig, Jr., C Detavernier, C Lavoie, J Jordan-Sweet, Axiotaxy of CoSi2 Thin Films on Si(100) Substrates and the Effects of Ti Alloying, J. Appl. Phys., 95(12), 8376 (2004).
  43. B Yen, B Schwickert, M Toney, Origin of Low-Friction Behavior in Graphite Investigated by Surface X-ray Diffraction, Appl. Phys. Lett., 84(23), 4702 (2004).[ premier ]
  44. T Thomson, M Toney, S Raoux, S Lee, S Sun, C Murray, B Terris, Structural and Magnetic Model of Self-assembled FePt Nanoparticle Arrays, J. Appl. Phys., 96, 1197 (2004).
  45. T Thomson, B Terris, M Toney, S Raoux, J Baglin, S Lee, S Sun, Silicide Formation and Particle Size Growth in High Temperature Annealed, Self-assembled FePt Nanoparticles, J. Appl. Phys., 95, 6738 (2004).
  46. W Prater, E Allen, W Lee, M Toney, J Daniels, J Hedstrom, Reduction of Resistivity in Cu Thin Films by Partial Oxidiation: Microstructural Mechanisms, Appl. Phys. Lett., 84, 2518 (2004).[ premier ]
  47. J Baglin, S Sun, A Kellock, T Thomson, M Toney, B Terris, C Murray, Ion Beam Stabilization of FePt Nanoparticle Arrays for Magnetic Storage, Materials Research Symposium Proceedings, Vol 777, p. 1, sponsored by Materials Research Society (2004).
  48. A Ozcan, K Ludwig, Jr., C Lavoie, S Basu, C Coia, C Cabral, Jr., K Rodbell, J Harper, Evolution of Microstructure in Ti-Ta Bilayer Thin Films on Polycrystalline-Si and Si(001), Thin Solid Films, 466, 238-249 (2004).
  49. C Detavernier, C Lavoie, R Van Meirhaeghe, CoSi2 Formation in the Presence of Ti, Ta or W, Thin Solid Films, 468, 174-182 (2004).
  50. P Mooney, S Koester, H Hovel, J Chu, K Chan, J Jordan-Sweet, J Ott, N Klymo, D Mocuta, Characterization ofSi/SiGe Heterostructures for Strained Si CMOS, Characterization and Metrology for ULSI Technology: 2003 International Conference, Vol CP683, p. 213-222, sponsored by American Institute of Physics (2003).
  51. R Leheny, S Park, R Birgeneau, J Gallani, C Garland, G Iannacchione, Smectic ordering in liquid-crystal–aerosil dispersions.  I.  X-ray scattering, Phys Rev. E: Stat. Phys., Plasmas, Fluids, 67(1), 011708 (2003).
  52. G Iannacchione, S Park, C Garland, R Birgeneau, R Leheny, Smectic ordering in liquid-crystal–aerosil dispersions. II. Scaling analysis, Phys Rev. E: Stat. Phys., Plasmas, Fluids, 67(1), 011709 (2003).
  53. S Sun, S Anders, T Thomson, J Baglin, M Toney, H Hamann, C Murray, B Terris, Controlled Synthesis and Assembly of FePt Nanoparticles, J. Phys. Chem. B, 107, 5419-5425 (2003). [ ]
  54. M Toney, W Lee, J Hedstrom, A Kellock, Thickness and Growth Temperature Dependence of Structure and Magnetism in FePt Thin Films, J. Appl. Phys., 93, 9902 (2003). [ ]
  55. S Anders, M Toney, T Thomson, J Thiele, B Terris, S Sun, C Murray, X-ray Studies of Magnetic Nanoparticle Assemblies, J. Appl. Phys., 93(10), 7343 (2003). [ ]
  56. S Anders, M Toney, T Thomson, R Farrow, J Thiele, B Terris, X-ray Absorption and Diffraction Studies of Magnetic Nanoparticle Assemblies, J. Appl. Phys., 93, 6299 (2003). [ ]
  57. M Toney, M Samant, T Lin, D Mauri, Thickness Dependence of Exchange Bias and Structure in PtMn and NiMn Spin Valves, Appl. Phys. Lett., 81, 4565 (2003). [ ][ premier ]
  58. M Toney, E Marinero, M Doerner, P Rice, High Anisotropy CoPtCrB Magnetic Recording Media, J. Appl. Phys., 94, 4018 (2003). [ ]
  59. C Detavernier, C Lavoie, F d'Heurle, Thermal Expansion of the Isostructural PtSi and NiSi: Negative Expansion Coefficient in NiSi and Stress Effects in Thin Films, J. Appl. Phys., 93(5), 2510-2515 (2003).
  60. C Lavoie, F d'Heurle, C Detavernier, C Cabral, Jr., Towards Implementation of a Nickel Silicide Process for CMOS Technologies, Microelectron. Eng., 70, 144-157 (2003). [ ]
  61. P Solomon, K Guarini, Y Zhang, K Chan, E Jones, G Cohen, A Krasnoperova, M Ronay, O Dokumaci, H Hovel, A Planar, Self-Aligned, Double Gate MOSFET Technology, IEEE Circuits Dev. Mag., 19(1), 48 (2003). [ ]
  62. T Xu, C Hawker, T Russell, Interfacial Energy Effects on the Electric Field Alignment of Symmetric Diblock Copolymers, Macromolecules, 36, 6178-6182 (2003).
  63. C Detavernier, A Ozcan, J Jordan-Sweet, E Stach, J Tersoff, F Ross, C Lavoie, An Off-Normal Fibre-Like Texture in Thin Films on Single-Crystal Substrates, Nature, 426, 641 (2003).[ premier ]
  64. P Mooney, S Koester, J Ott, J Jordan-Sweet, J Chu, K Chan, Thermal Stability of Strained Si on Relaxed Si(1-x)Ge(x) Buffer Layers, Materials Research Society Symposium on Materials Issues in Novel Si-Based Technology, Vol 686, p. 3-8, sponsored by Materials Research Society (2002). [ ]
  65. A Ozcan, K Ludwig, C Cabral, Jr., C Lavoie, J Harper, Texture Formation in Ti-Ta Alloy Disilicide Thin Films, J. Appl. Phys., 92(12), 7210 (2002). [ ]
  66. A Gungor, K Barmak, A Rollett, C Cabral, Jr., J Harper, Texture and Resistivity of Dilute Binary Cu(Al), Cu(In), Cu(Ti), Cu(Nb), Cu(Ir), and Cu(W) Alkloy Thin Films, J. Vac. Sci. Technol., A, 20(6), 2314 (2002). [ ]
  67. S Rossnagel, I Noyan, C Cabral, Jr., Phase Transformation of Thin Sputter-deposited Tungsten Films at Room Temperature, J. Vac. Sci. Technol., B, 20(5), 2047 (2002). [ ]
  68. G Cohen, C Cabral, Jr., C Lavoie, P Soloman, K Guarini, K Chan, R Roy, A Self-aligned Process for Thin Silicon-on-insulator MOSFETS and Bulk MOSFETS with Shallow Junctions, 59th Annual Device Research Conference June 2001, Vol 686, p. 89, sponsored by Material Research Symp. Proc. (2002). [ ]
  69. G Cohen, C Cabral, Jr., C Lavoie, P Soloman, K Guarini, K Chan, R Roy, A Self-aligned Silicide Process Utilizing Ion Implantation for Reduced Silicon Consumption and Control of the Silicide Formation Temperature , Materials Research Society Symposium Proceedings, Vol 716, p. 35, sponsored by Materials Research Society (2002). [ ]
  70. H Kim, C Cabral, Jr., C Lavoie, S Rossnagel, The Growth of Tantalum Thin Films by Plasma-Enhanced Atomic Layer Deposition and Diffusion Barrier Properties , Materials Research Society Symposium Proceedings, Vol 716, p. 407, sponsored by Materials Research Society (2002). [ ]
  71. R Bandhu, R Sooryyakumar, R Farrow, D Weller, M Toney, T Rabedeau, Elastic Properties of Chemically Ordered Co3Pt Thin Films, J. Appl. Phys., 91, 2737 (2002). [ ]
  72. P Mooney, Materials for Strained Si Devices, Int. J. High Speed Electr. And Syst., 12, 305-314 (2002). [ ]
  73. P Mooney, Materials for Strained Si Devices, Selected Topics in Electronics and Systems, p. 99-108, World Scientific, New Jersey (2002). [ ]
  74. S Kaldor, I Noyan, Differentiating between elastically bent rectangular beams and plates, Appl. Phys. Lett., 80(13), 2284-2286 (2002).[ premier ]
  75. S Park, R Leheny, R Birgeneau, J Gallani, C Garland, G Iannacchione, Hydrogen-bonded silica gels dispersed in a smectic liquid crystal: A random field XY system, Phys Rev. E: Stat. Phys., Plasmas, Fluids, 65(5), 050703(R) (2002).
  76. V Kiryukhin, T Koo, A Borissov, Y Kim, S Nelson, J Hill, D Gibbs, S Cheong, Common Features of nanoscale structural correlations in magnetoresistive manganites with a ferromagnetic low-temperature state, Phys. Rev. B: Condens. Matter, 65, 094421 (2002).
  77. C Lavoie, C Cabral, Jr., F D'Heurle, J Jordan-Sweet, J Harper, Effects of Alloying Elements on Cobalt Silicide Formation, J. Electron. Mater., 31(6), 597 (2002).
  78. G Lucadamo, K Barmak, C Lavoie, C Cabral, Jr., C Michaelsen, Metastable and Equilibrium Phase Formation in Sputter Deposited Ti/Al Multilayer Films, J. Appl. Phys., 91(12), 9575 (2002).
  79. H Kim, C Cabral, Jr., C Lavoie, S Rossnagel, Diffusion Barrier Properties of Transition Metal Thin Films Grown by Plasma Enhanced Atomic Layer Deposition, J. Vac. Sci. Technol., B, 20(4), 1321 (2002).
  80. A Ozcan, K Ludwig, Jr., C Cabral, Jr., J Harper, In Situ Studies of Silicide Formation in TiTa Bilayer Thin Films on Poly-Silicon, Materials Research Society Symposium, Vol 721, p. 1, sponsored by Materials Research Society (2002).
  81. S Kaldor, X-ray Microbeam Studies of Anticlastic Curvature in Elastically Bent Silicon Beams and Plates, Ph.D. Thesis. Columbia University, New York (2002).
  82. H Ishibashi, T Yoo, Y Hor, A Borissov, Y Horibe, P Radaelli, S Cheong, V Kiryukhin, X-ray-induced Disordering of the Dimerization Pattern and Apparent Low-temperature Enhancement of Lattice Symmetry in Spinel CuIr2S4, Phys. Rev. B: Condens. Matter, 66, 144424 (2002).
  83. A Ozcan, K Ludwig, P Rebbi, C Cabral, Jr., C Lavoie, J Harper, Texture of TiSi2 Thin Films on Si(001), J. Appl. Phys., 92, 5011 (2002).
  84. A Ozcan, K Ludwig, Jr., C Lavoie, C Cabral, Jr., J Harper, R Bradley, Nucleation and Growth Kinetics of Preferred C54 TiSi2 Orientations: Time-resolved X-ray Diffraction Measurements, J. Appl. Phys., 92, 5189 (2002).
  85. S Kaldor, C Noyan, Effects of Boundary Conditions and Anisotropy on Elastically Bent Silicon, Exp. Mech., 42(3), 353-358 (2002).
  86. A Ozcan, K Ludwig, C Cabral, Jr., C Lavoie, J Harper, Influence of Substrate Temperature During Sputter Deposition on the Subsequent Formation of Titanium Disilicide, Materials Research Symposium, Vol 745, p. 241, sponsored by Materials Research Society (2002).
  87. Y Wang, Synchrotron X-ray Scattering Study of Non-magnetic Ions Doped CuGeO3, Ph.D. Thesis. MIT, Cambridge (2001).
  88. R Martel, V Derycke, C Lavoie, J Appenzeller, K Chan, J Tersoff, P Avouris, Ambipolar Electrical Transport in Semiconducting Single-wall Carbon Nanotubes, Phys. Rev. Lett., 87, 256805 (2001).[ premier ]
  89. L Oblonsky, A Davenport, M Ryan, M Toney, In-situ XRD Study of the Passive Film that Forms on Iron in Borate Buffer, Proceedings of 8th International Conference on Passivity of Metals and Semiconductors 1999, Jasper, Canada, p. 173-179 (2001).
  90. M Ryan, M Toney, L Oblonsky, A Davenport, The Structure of the Passive Film that Forms on Iron in Aqueous Environments, Solid-Liquid Interface Theory, p. 85, American Chemical Society, Washington (2001).
  91. J Chun, P Desjardins, C Lavoie, I Petrov, C Cabral, Jr., J Greene, Interfacial Reaction Pathways and Kinetics During Annealing of 111-textured Al/TiN Bilayers: A Synchrotron X-ray Diffraction and Transmission , J. Vac. Sci. Technol., A, 19, 2207 (2001).
  92. F D'Heurle, S Zhang, C Lavoie, P Gas, C Cabral, Jr., J Harper, Formation of C54 TiSi2: Effect of Niobium Addition on the Apparent Activation Energy, J. Appl. Phys., 90(11), 6409 (2001).
  93. C Lavoie, C Cabral Jr., F D'Heurle, J Harper, Exploring Thin Film Reactions Using Simultaneous X-ray, Surface Roughness, and Resistance Measurements, Defect Diffus Forum, 194-199, 1477 (2001).
  94. J Chun, J Carlsson, P Desjardins, D Bergstrom, I Petrov, J Green, C Lavoie, C Cabral Jr., L Hultman, Synchrotron X-ray Diffraction and Transmission Electron Microscopy Studies of Interfacial Reaction Paths and Kinetics During Annealing of Fully-002-textured Al/TiN Bilayers, J. Vac. Sci. Technol., A, 19(1), 182-191 (2001).
  95. A Quintero, M Libera, C Cabral Jr., C Lavoie, J Harper, Two Step Codeposition Process for Enhanced C54-TiSi2 Formation in the Ti-Si Binary System, J. Appl. Phys., 89(9), 4879-4885 (2001).
  96. J Chun, P Desjardins, C Lavoie, C Shin, C Cabral Jr., I Petrov, J Greene, Interfacial Reactions in Epitaxial Al/TiN(111) Model Diffusion Barriers: Formation of an Impervious Self-limited Wurtzite-structure AlN(0001) Blocking Layer, J. Appl. Phys., 89(12), 7841-7845 (2001).
  97. J Chun, P Desjardins, I Petrov, J Greene, C Lavoie, C Cabral Jr., Interfacial Reaction Pathways and Kinetics During Annealing of Epitaxial Al/TiN(001) Model Diffusion Barrier Systems, Thin Solid Films, 391, 69-80 (2001).
  98. F Nolting, A Scholl, J Stohr, J Seo, J Fompeyrine, H Slegwart, J Locquet, S Anders, M Toney, Direct Observation of the Alignment of Ferromagnetic Spins by Antiferromagnetic Spins, Nature, 405, 767-769 (2001).[ premier ]
  99. S Park, Physics of Liquid Crystals Embedded in Silica Gels, Ph.D. Thesis. MIT, Cambridge (2001).
  100. R Christianson, X-ray & Neutron Scattering Studies of Rb2MnF4 and Cu1?xMgxGeO3 in an External Magnetic Field, Ph.D. Thesis. MIT, Cambridge (2001).
  101. X Wang, K Ludwig, O Malis, J Mainville, X Flament, R Caudron, Temperature Dependence of the Diffuse-Scattering Fine Structure in Cu-Pd Alloys, Phys. Rev. B: Condens. Matter, 63, 092201 (2001).
  102. X Wang, X-ray Studies of Ordering in Cu-Pd Long-Period Superlattice Alloys, Ph.D. Thesis. Boston University, Boston (2001).
  103. C Cabral Jr., C Lavoie, J Harper, J Jordan-Sweet, The Use of InSitu X-ray Diffraction, Optical Scattering and Resistance Analysis Techniques for Evaluation of Copper Diffusion Barriers in Blanket Films and Danascene Structures, Thin Solid Films, 397(1-2), 194 (2001).
  104. M Doerner, X Bian, M Madison, K Tang, Q Peng, A Polcyn, T Arnoldussen, M Toney, M Mirzamaani, Demonstration of 35 Gbit/in2 Media on a Glass Substrate, IEEE Trans. Magn., 37(2), 1052 (2001).
  105. W Lee, M Carey, M Toney, P Rice, B Gurney, H Chang, E Allen, D Mauri, Oxygen-enhanced IrMn Spin Valves Deposited by Ion-beam and Magnetron Sputtering, J. Appl. Phys., 89(11), 6925-6927 (2001).
  106. K Saenger, C Cabral, Jr., P Duncombe, A Grill, D Neumayer, Oxygen Stoichiometry in PdOx and Pdox/Pt Electrode Layers During Processing of Ferroelectrics and High-Epsilon Perovskites, J. Mater. Res., 15(4), 961 (2000).
  107. C Lavoie, C Cabral Jr., J Harper, G Tas, C Morath, R Stoner, H Maris, Detection of Cobalt Silicide Phase Formations by Ultrafast Optical Measurements, Thin Solid Films, 374, 42-48 (2000).
  108. K Barmak, G Lucadamo, C Cabral, C Lavoie, J Harper, Dissociation of Dilute Immiscible Copper Alloy Thin Films, J. Appl. Phys., 87(5), 2204 (2000).
  109. J Harper, C Cabral, C Lavoie, Mechanisms for Enhanced Formation of the C54 Phase of titanium Silicide Ultra-Large-Scale-Integration Contacts, Annu. Rev. Mater. Sci., Vol 30, p. 523 (2000).
  110. K Barmak, G Lucadamo, C Cabral, C Lavoie, J Harper, Classification of the Modes of Dissociation in Immiscible Cu-Alloy Thin Films, Mat. Res. Symp. Proc., Vol 564, p. 341 (1999).
  111. C Engstrom, J Birch, L Hultman, C Lavoie, C Cabral, J Jordan, Interdiffusion Studies of Single Crystal TiN/NbN Supperlattice Thin Films by X-ray Diffraction, J. Vac. Sci. Technol., A, A17(5), 2920 (1999).
  112. G Liao, R Bansil, K Ludwig, C Konak, Small Angle X-ray Scattering Study of Kinetics of Spinodal Decomposition in N-isopropylacrylamide Gels, Phys Rev. E: Stat. Phys., Plasmas, Fluids, 60, 4473 (1999).
  113. G Lucadamo, K Barmak, J Rickman, C Lavoie, C Cabral, C Michaelsen, Microstructure Evolution During Solid-State Reaction in Polycrystalline Nb/AI and Ti/AI Multilayer Thin Films, Mat. Res. Symp. Proc., Vol 562, p. 159 (1999).
  114. O Malis, K Ludwig, Kinetics of Phase Transitions in Equiatomic CuAu, Phys. Rev. B: Condens. Matter, 60, 14675 (1999).
  115. A Mouroux, M Roux, S Zhang, F D'Heurle, C Cabral, C Lavoie, J Harper, Phase Formation and Resistivty of the Ternary System Ta-Nb-Si, J. Appl. Phys., 86(4), 2323 (1999).
  116. K Saenger, C Cabral, Jr., C Lavoie, S Rossnagel, Thermal Stability and oxygen-Loss Characteristics of Pt(O) Films Prepared by Reactive Sputtering, J. Appl. Phys., 86, 6084 (1999).
  117. R Roy, C Cabral Jr., C Lavoie, The Future of Silicides for CMOS Contacts, Materials Research Symposium Proceedings, Vol 564, p. 35 (1999).
  118. G Lucadamo, K Barmak, S Hyun, C Cabral, Jr., C Lavoie, Evidence of a two-stage reaction mechanism in sputter deposited Nb/Al multilayer thin-films studied by in situ synchrotron X-ray diffraction, Mater. Lett., 39, 268-273 (1999).

[ premier ] - A publication is considered premier if the journal has an impact factor of 6 or greater (from Journal Citation Report 2003, Thomson Institute for Scientific Information). These journals represent approximately the top 3% of all journals. Two additional journals are included in the NSLS premier list, Applied Physics Letters (impact factor 4.0) and Environmental Sciences and Technology (impact factor 3.6), because these journals represent the "best in class" for the NSLS industrial and environmental science users, even though their impact factors are less than 6.