The first set shows the first 2 ns of µMAG Standard Problem 4, Field 1 (170° from positive x-axis). The cell discretization size is 3.125 nm. Each frame represents 5 ps. Additional details may be gleaned from the various input files, and also the µMAG standard problem report. The three movies show the same data, but with different color encodings:
µMAG Problem 4, Field 1 | ||||||
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Divergence: | QuickTime | 8 292 442 bytes | MPEG | 9 064 538 bytes | ||
XY-Angle: | QuickTime | 9 148 538 bytes | MPEG | 7 939 036 bytes | ||
YZ-Angle: | QuickTime | 10 927 458 bytes | MPEG | 11 845 454 bytes |
In the first movie, color indicates divergence, with blue where the divergence is negative, red where the divergence is positive, and white where the divergence is zero. The XY-Angle movie is colored using a red-green-blue-red color wheel, based on the angle of the magnetization from the negative y axis, measured counterclockwise in the xy-plane. The YZ-angle movie is similar, except there the angle is taken in the yz-plane.
The following set of movies is analogous to the first, but is from a run on µMAG Standard Problem 4, Field 2 (190° from positive x-axis):
µMAG Problem 4, Field 2 | ||||||
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Divergence: | QuickTime | 9 383 658 bytes | MPEG | 10 693 127 bytes | ||
XY-Angle: | QuickTime | 9 672 714 bytes | MPEG | 9 663 428 bytes | ||
YZ-Angle: | QuickTime | 11 628 754 bytes | MPEG | 13 413 468 bytes |
The color encoding is the same as in the first set of movies.
This software was developed at the National Institute of Standards and Technology by employees of the Federal Government in the course of their official duties. Pursuant to Title 17, United States Code, Section 105, this software is not subject to copyright protection and is in the public domain.
OOMMF is an experimental system. NIST assumes no responsibility whatsoever for its use by other parties, and makes no guarantees, expressed or implied, about its quality, reliability, or any other characteristic.
We would appreciate acknowledgment if the software is used.
michael.donahue@nist.gov