Microscope: Scanning Probe - DI Nanoscope IIIa Multimode
Quick Specs
- Up to atomic-level resolution
- Operates in air and liquid environments in many modes
- Maximum scan area of 165 μm x 165 μm
The Digital Instrument (DI) Nanoscope IIIa multimode scannning probe microscope is primarily used to obtain topographical information on nanostructures, nanodevices, and quantum dots; thin films (oxide surfaces, spintronics, magnetic storage, and semiconductors); geological and geochemical samples; protein and biomolecule structures at surfaces; and samples undergoing electrochemical and corrosion processes. Resolution ranges from the submicron-length scale (nanoscale) to the atomic level. This powerful instrument allows the user to obtain surface roughness statistics, image small nanosized structures, and even image individual atoms on a surface.
The instrument is capable of operating in both air and liquid environments and in several modes that include contact, tapping, frictional force, phase/frequency, magnetic/electrostatic force, tunneling, and capacitance. As a real space probe, the instrument can be used to probe surface morphology; defects; dopant concentrations; and electrostatic, magnetic, and mechanical properties of conducting and non conducting materials.
All work with the multimode scanning probe microscope must be performed in compliance with EMSL practices and permits.
Performance Specifications
This instrument can achieve ultimate resolution in contact mode at the atomic level (on mica, calcite, and graphite surfaces). Microscope resolution in tapping mode is approximately at the nanometer scale laterally and Angstrom scale vertically. The maximum scan area is 165 μm x 165 μm.
System Configuration and Operational Overview
This instrument resides in a double-glazed enclosure that provides a sound-reducing environment. Four pneumatic isolators provide vibration isolation. The high headspace of the enclosure permits convenient viewing of both sample and tip via a charge-coupled diode camera. Additional environmental control can be accomplished by controlling temperature and gas flow into the glass enclosure. For high-resolution work, the microscope can be moved to an actively damped air table surrounded by an acoustically damped enclosure.
The microscope is equipped with two scanners: one is 165 μm x 165 μm in area with 6 μm vertical range, and the other is 17μm x 17μm with 3.5 μm vertical range. The maximum sample size in air is about 12 mm x 12 mm in area and 0.5-cm thick. The sample size in liquid must be between 10 mm x 10 mm and 12 mm x 12 mm in area to ensure a seal between the sample and the liquid cell. As a whole, samples must not be too rough in surface.
The system is equipped with a syringe pump for controlling the rate of liquid that flows through the enclosed liquid cell. The volume of the liquid cell is approximately 20 μL with an exposed surface area of 28 mm2.
EMSL researchers recently added a scanning capacitance mode in which a user can image and receive concentration information on distribution of charge carriers in semiconductor devices. In the case of other operational modes, researchers can map out magnetic domains using magnetic-force microscopy, charge distribution using electrostatic force microscopy, density of states using scanning tunneling microscopy, and elastic properties using force modulation imaging in atomic force microscopy. Individuals can use this instrument independently, following training provided depending on experience and desired analysis.
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