The need for improved spatial resolution currently limits the ability of industry to answer key questions regarding the chemical composition of surfaces and interfaces. Needs range from improved chemical and structural diagnostics to phase identification and trace compositional analysis. In addition to meeting current industry needs in these areas, there is a continuing demand for new measurement methods to be developed that will be positioned to meet emerging measurement challenges. NIST/CSTL develops measurement tools that enable chemical characterization of elements, isotopes, and molecules at millimeter to nanometer spatial scales with major, minor, and trace concentrations. These tools are developed such that the �microspatial� relationships can be correlated with specific macroscopic properties. |
Recent Technical Activities Related to NanotechnologyElectron Microscopy and Spectroscopy
Scanned Probe Microscopy and Spectroscopy
Additional Activities
Technical Contact: Greg Gillen |
Other NIST Research in Nanotechnology | National Nanotechnology Initiative |
Last Updated
March 5, 2002
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Web Contact micro@nist.gov