Precision Engineering Division |
Welcome to the Precision
Engineering Division (PED), one of five divisions of the Manufacturing
Engineering Lab at the National
Institute of Standards and Technology. |
PED Mission |
The mission of PED is to provide the foundation of dimensional measurement
that meets the needs of the U.S. industrial and scientific communities
by: |
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conducting research in dimensional
measurements; |
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developing measurement methods; |
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providing measurement services;
and |
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disseminating the resulting technology
and length-based standards. |
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The PED mission reflects its responsibility to perform four core
functions: Research, Development, Measurement Services, and Information
Dissemination. Each core function includes a variety of processes
which serve numerous customers, collectively identified as industrial
and scientific communities, both public and private. PED values
accuracy, responsiveness, objectivity, value, knowledge, expertise,
state of the art, integrity, and honesty in the performance of this
mission. |
PED Functional Statement |
The mission of PED is to conduct research and development in precision-engineered
length-metrology-intensive systems in both measuring and production
machines. PED delivers to industry important length-related measurements,
standards, and technology services that supports U.S. manufacturing's
products and processes. Features of interest range in size from
multiple meters to sub-nanometer. These are measured by framed and
frameless general special-purpose measuring probes, machines, and
systems. The spectrum includes optical, mechanical, electrical,
and quantum-mechanical phenomena using the first-principle of the
Systeme Internationale (SI) unit of length (modernized metric system)
by means of stabilized lasers and displacement interferometry. |
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| Supports the division's mission with
a concentration on measurements of one meter or larger. For example,
measurements are made by coordinate measuring machines and frameless
coordinate length-metrology systems. These involve mechanical-probe,
laser-ranging, theodolite, and related interferometric systems. |
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| Supports the division's mission with
a concentration on measurements of one millimeter to one meter.
These measurements are often of complex shape, such as turbine blades,
threaded fasteners, and gears. Measurements are made by general
and special-purpose feature and coordinate measuring systems. |
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| Supports the division's mission with
a concentration on measurements of one micrometer to one millimeter
where surface roughness and microform are critical. Measurements
are made by tunneling microscopes, mechanical profilometry, phase-measuring
interferometry and related techniques. |
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| Supports the division's mission with
a concentration on measurements of one nanometer to one micrometer.
Measurements are made by tunneling, atomic-force, electron, and
visible- and ultraviolet-light microscopies. The group places special
emphasis on satisfying the advanced needs of U.S. microelectronic
manufacturing industries. |
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