MEL Home National Institute of Standards and Technology
Providing the measurements and standards needs of discrete-parts manufacturers in advanced manufacturing technology
MMD STAFF DIRECTORY
Kevin Jurrens, Acting Chief
Alma Duke, Secretary
Mass and Force Group
Zeina Jabbour, Leader
Jeanne Bruins, Secretery
Patrick Abbott
Tom Bartel
Kevin Chesnutwood
Sam Ho
Vincent Lee
Linda Martinez
Jon Pratt
Brian Scace
Rick Seifarth
Gordon Shaw
Greg Vogl, Postdoc
Joe Chalfoun, Guest Researcher
Koo-Hyun Chung, Guest Researcher
Min Seok Kim, Guest Researcher
Ruimin Liu, Guest Researcher
Joe Maurer, Guest Researcher
Jay Wallace, Guest Researcher
Machine Tool Metrology Group
Alkan Donmez, Leader
Michelle Masser, Secretery
Herb Bandy
Brad Damazo
Dave Evans
Manny Hahn
Kari Harper
Mike McGlauflin
Shawn Moylan
Alexander Boutin, Summer Student
Peter K J Lee, Guest Researcher
Bev Payne, Guest Researcher
Manufacturing Process Metrology Group
Johannes Soons, Leader
Michelle Masser, Secretery
Ulf Griesmann
Rob Ivester
Mike Kennedy
Dick Rhorer
Eric Whitenton
Ivan Arriola, Guest Researcher
JiYoung Chu, Guest Researcher
Kaushal Desai, Guest Researcher
Guangjun Gao, Guest Researcher
Jarred Heigel, Guest Researcher
Quandou Wang, Guest Researcher
Sensor Developement and Application Group
Kang Lee, Leader
Myriam Parra, Secretery
Steve Fick
Mike Huff
Victor Nedzelnitsky
Toni Savoy
Randy Wagner
George Luo, Summer Student
Tom Proctor, Guest Researcher
Eugene Song, Guest Researcher
RuQiang Yan, Guest Researcher
Last Update: June 2008