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Y. Tina Lee

National Institute of Standards & Technology
100 Bureau Drive, MS 8260
Gaithersburg, Maryland 20899-8260
USA

Phone: (301) 975-3550
Fax: (301) 258-9749
Email: leet@cme.nist.gov


BIO
Yung-Tsun Tina Lee is a computer scientist of the Manufacturing Engineering Laboratory at the National Institute of Standards and Technology (NIST). She joined NIST in 1986. Her major responsibility in recent years has been to develop information models to support various manufacturing application areas. She is a member of Institute of Electrical and Electronics Engineers (IEEE) Standards Association, and Simulation Interoperability Standards Organization (SISO). Prior to NIST, she worked at the Contel Federal Systems, Sperry Corporation, and Research and Data Systems, Inc. She earned her BA in Mathematics from Providence College , Taichung , Taiwan and MS in Applied Science from College of William and Mary, Williamsburg , Virginia .


PUBLICATIONS
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PUBLICATIONS:

  • Lee, Y. T., and McLean, C.R., A Neutral Data Interface Specification for Simulating Machine Shop Operations, To appear in the Production Planning and Control, Taylor & Francis, Abingdon,U.K./Philadelphia, PA, 2006.
  • Lee, Y. T. and Luo, Y., Data Exchange for Machine Shop Simulation, To appear in the Proceedings of the 2005 Winter Simulation Conference, Orlando, FL, December 4-7, 2005.
  • Lee, Y. T., Luo, Y., and Shao, G. G., Prototype Implementation Based on the Machine Shop Information Model, Proceedings of the IFIP 5.7 Advances in Production Management System Conference, Rockville, MD, September 18-21, 2005.
  • McLean, Charles, Jain, Sanjay, Lee, Y. T., Riddick, Frank, A Simulation and Gaming Architecture for Manufacturing Research, Testing, and Training, Proceedings in the IFIP 5.7 Advances in Production Management System Conference, Rockville , MD , September 18-21, 2005.  (Also published as NISTIR 7256, NIST, Gaithersburg , MD , August 2005.)
  • Lee, Y. T. and Luo, Y., Data Transfer Strategy for Machine Shop Simulation, NISTIR 7239, NIST, Gaithersburg, MD, June 2005.
  • Luo, Y., and Lee, Y. T., Application of Machine Shop Data Model in Manufacturing Simulation, Proceedings of the Conference on Modeling, Simulation and Visualization Methods (MVS’05), pp 3-5, Las Vegas, NE, June 27-30, 2005, CSREA Press, USA.
  • McLean, C., Lee, Y. T., Shao, G. G., and Riddick, F., Shop Data Model and Interface Specification, NISTIR 7198, NIST, Gaithersburg , MD , January 2005.  (A total of 127 pages)
  • McLean, C., Riddick, F., and Lee, Y. T., An Architecture and Interfaces for Distributed Manufacturing Simulation, SIMULATION, Vol. 81, Issue 1, January 2005, pp 15-32, SAGE Publications, London, U.K./Thousand Oaks, CA.
  • Umeda, S., and Lee, Y. T., Design Specifications of a Generic Supply Chain Simulator, Proceedings of the 2004 Winter Simulation Conference, December 5-8, 2004.
  • Luo, Y., and Lee, Y. T., A Database Application for Manufacturing Simulation System Integration, Proceedings of the 15th IASTED International Conference on Modeling and Simulation, pp 161-166, Marina Del Rey, CA, 2004, ACTA Press, Anaheim, CA/Calgary, Canada/Zurich, Switzerland.
  • Umeda, S., and Lee, Y. T., Integrated Supply Chain Simulation System – A Design Specification for a Generic Supply Chain Simulator, NISTIR 7146, NIST, Gaithersburg, MD, July 2004.
  • Lee, Y. T., and Luo, Y., A Database Design for the Machine Shop Information Model, NISTIR 7077, NIST, Gaithersburg, MD, December 2003. (A total of 147 pages)
  • Lee, Y. T., McLean, C., and Shao, G., A Neutral Information Model for Simulating Machine Shop Operations, Proceedings of 2003 Winter Simulation Conference, New Orleans, LA, December 7-10, 2003.
  • Shao, G., Lee, Y. T., and McLean C., Manufacturing Data Validation Through Simulation, Proceedings of the 2003 European Simulation and Modeling Conference, pp 56-60, Naples, Italy, October 27-29, 2003.
  • McLean, C. and Lee, T., A Neutral Data Interface Specification for Simulating Machine Shop Operations, Proccedings of the IFIP WD5.7 Working Conference on Human Aspects in Production management, Volume 2, pp 110-116, Karlsruhe, Germany, October 5-9, 2003.
  • Lee, Y. T., Luo, Y., and McLean, C., Interface Model Supporting Distributed Simulation, Proceedings of International Industrial Simulation Conference 2003, ( Valencia , Spain , June 9-11, 2003), pp 307-311, Shaker Verlag GmbH, AAchen , Germany .
  • Lee, Y. T. and Umeda, S., An IDEF1x Information Model for a Supply Chain Simulation, Proceedings of the 7th International Conference on Manufacturing, Bangkok, Thailand, November 25-29, 2002, pp 291-296, PCMM, Victoria, Australia.
  • Shao G., Lee, Y. T., and McLean, C. R., Software Design Document for the Computer-Aided Manufacturing Engineering Toolkit, To be appear in NISTIR, NIST, Gaithersburg , MD.
  • McLean, C. R., Jones, A., Lee, Y. T., and Riddick, F. H., An Architecture for a Generic Data-Driven Machine Shop Simulation, Proceedings of 2002 Winter Simulation Conference, San Diego, CA, December 8-11, 2002, pp1108-1116.
  • Lee, Y. T., and Umeda S., Interface Specification for a Supply Chain Simulation, NISTIR 6832, NIST, MD, November 2001.
  • Lee, Y. T., McLean, C. R., and Umeda, S., A Preliminary Information Model for a supply Chain Simulation, Proceedings of the 4th International EUROSIM Congress - Shaping Future with Simulation, Delft , the Netherlands , June 26-29, 2001.
  • Lee, Y. T., Soons, J. A., and Donmez, M. A. Information Model for Machine-Tool-Perfor­mance Tests, Journal of Research of the National Institute of Standards and Technology, Vol. 106, No. 2, NIST, Gaithersburg, MD, March-April 2001, pp 413-439.
  • Umeda, S., and Lee, Y. T., Management Data Specification for Supply Chain Integration, NISTIR 6703, NIST, Gaithersburg , MD , January 2001.
  • Lee, Y.T., An Activity Model For Ship Repair and Conversion, Proceedings of the 5th Annual International Conference on Industrial Engineering - Theory, Applications and Practices (or IE Conference 2000), Tai­wan, Dec.13-15, 2000.
  • Lee, Y. T., Soons, J. A., and Donmez, M. A., Information Model for Machine-Tool-Perfor­mance Tests, NISTIR 6580, NIST, Gaithersburg, MD, November 2000.
  • Lee, Y. T., Mclean, C. R., and Leong, S., Activity Model: Ship Repair and Conversion, NIS­TIR 6533, NIST, Gaithersburg , MD , June 2000.
  • Lee, Y. T., Information Modeling - from Design to Implementation, Proceedings of the Sec­ond World Manufacturing Congress, Universities of Durham, Durham, U.K., Septem­ber 27-30, 1999, pp 315-321, ICSC, Canada/Switzerland.
  • Lee, Y. T., An Overview of Information Modeling for Manufacturing Systems Integration, NISTIR 6382, NIST, Gaithersburg, MD, August 1999.
  • Lee, Y. T., Initial Manufacturing Exchange Specification (IMES): Information Model for the Process Plan - Workstation Level, NISTIR 6307, NIST, Gaithersburg , MD , March 1999.
  • Lee, Y. T., Data Sharing Implementation Based on the Information Model for Apparel Pattern Making, Proceedings of the Joint Conference of the 5th International Conference on Automa­tion Technology and 1998 International Conference of Production Research, Taipei, Taiwan, July 1998.
  • Lee, Y. T., Initial Manufacturing Exchange Specification (IMES): Requirements Analysis for the Plant Layout Application, NISTIR 6139, NIST, Gaithersburg , MD , July 1998.
  • Ellis, K., Jones, A., and Lee, T., Requirements Analysis: Process Plan Specification - Workstation Level, NISTIR 6172, NIST, Gaithersburg , MD , June 1998.
  • Bartolotta, A., McLean, C. R., Lee, Y. T., and Jones, A., Production Systems Engineering: Requirements Analysis for Discrete-Event Simulation, NISTIR 6154, NIST, Gaithersburg , MD , April 1998.
  • Lee, Y. T., Data Sharing Implementation Based on the Information Model for Apparel Pattern Making, NISTIR 5969, NIST, Gaithersburg , MD , January 1997.
  • Lee, Y. T., Extensions of the Prototype Application Protocol of Ready-to-Wear Apparel Pattern Making, NISTIR 5727, NIST, Gaithersburg, MD, October 1995.
  • Moncarz, H. T., and Lee, Y. T., CALS Technologies Applied to the Fiber/Textile/Apparel Industry, CALS/Enterprise Integration Journal, summer 1994.
  • Lee, Y. T., Body Dimensions for Apparel, NISTIR 5411, NIST, Gaithersburg , MD , April 1994.
  • Lee, Y. T., A Bibliography on Apparel Sizing and Related Issues, NISTIR 5365, NIST, Gaithersburg , MD , February 1994.
  • Moncarz, H.T., and Lee, Y. T., Report on Scoping the Apparel Manufacturing Enterprise , International Journal of Clothing Science and Technology, Vol. 5, Number 3/4, 1993, pp 6-18, MCB University Press, West Yorkshire, England .
  • Lee, Y. T., and Moncarz, H. T., A Prototype Application Protocol for Ready-to-Wear Pattern Making, NISTIR 5115, NIST, Gaithersburg, MD, January 1993.
  • Moncarz, H.T., and Lee, Y. T., Report on Scoping the Apparel Manufacturing Enterprise , NISTIR 5106, NIST, Gaithersburg , MD , January 1993.
  • Lee, Y. T., Apparel Product Data Exchange Standard, Proceedings of the Third Academic Apparel Research Conference on Implementing Advanced Technology, Atlanta , Georgia , Feb­ruary 1992.
  • Moncarz, H. T., and Lee, Y. T., Apparel STEP Translator, NISTIR 4612, NIST, Gaithersburg , MD , June 1991.
  • Lee, Y. T., On Extending the Standard for the Exchange of Product Data to Represent Two- Dimensional Apparel Pattern Pieces, NISTIR 4358, NIST, Gaithersburg, MD, June 1990.
  • Lee, Y. T., and Ressler, S., Converting the AMRF Part Model Report to a PDES/STEP Sub­set, NBSIR 88-3818, NIST, Gaithersburg , MD , July 1988.
  • Rangaswamy, S., and Lee, Y. T., Evaluation of the Utility of Channel 4 and 5 of the Thematic Mapper Sensor, NAS 5-26123, NASA/GSFC, Greenbelt, MD, 1982.
  • Rangaswamy, S., and Lee, Y. T., Evaluation of the Improved Spatial, Spectral, and Radiomet­ric Capability of the Thematic Mapper Sensor, NAS 5-25766, NASA/GSFC, Greenbelt, MD, 1981.



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Date Created: November 7, 2005
Last Modified: November 8, 2005


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