Publication Details
Orientation and temperature dependence of the tensile behavior of GaN nanowires: an atomistic study
Citation
Wang Z, XT Zu, L Yang, F Gao, and WJ Weber. 2008. "Orientation and temperature dependence of the tensile behavior of GaN nanowires: an atomistic study." Journal of Materials Science. Materials in Electronics 19(8-9):863-867. doi:10.1007/s10854-007-9526-8
Journal Article
Abstract
Gallium nitride (GaN) is a high-temperature semiconductor material of considerable interest. It emits brilliant light and has been considered as a key material for the next generation of high frequency and high power transistors that are capable of operating at high temperatures. Due to its anisotropic and polar nature, GaN exhibits direction-dependent properties. Growth directions along [001], [1-10] and [110] directions have all been synthesized experimentally. In this work, molecular dynamics simulations are carried out to characterize the mechanical properties of GaN nanowires with different orientations at different temperatures. The simulation results reveal that the nanowires with different growth orientations exhibit distinct deformation behavior under tensile loading. The nanowires exhibit ductility at high deformation temperatures and brittleness at lower temperature. The brittle to ductile transition (BDT) was observed in the nanowires grown along the [001] direction. The nanowires grown along the [110] direction slip in the {010} planes, whereas the nanowires grown along the [1-10] direction fracture in a cleavage manner under tensile loading.
