Manufacturing Engineering Laboratory NIST logo
HOME About MEL Research products and services what's new search

Return to MEL's Gallery
line

Select a Research Area

Calibration Research
line

Material Removal Processes
line

Coordinate and Machine Tools
line

Laser and Optics
line

Surface and Nano
line

Interoperability / Integration
line

Simulation, Visualization and Modeling
line

Intelligent Systems
line

Homeland Security
line

Intelligent Control of Mobility Systems
line

Fabrication Technology
line

 

melwebmaster@nist.gov

Date created: March 20, 2004
Last updated: Feb. 28, 2007

MEL Gallery - Calibration Research

Click on a photo to enlarge the picture and get a caption and links to related research

Scanning electron microscope
scanning electron microscope
Optical Overlay Metrology System
US National Prototype Kilogram
US National Prototype Kilogram
high precision mass comparator
cmm
Ultrasonic Transducer
16
Gage Blocks
Pistonphone Special Test
Advanced Automated Master Angle Calibration
System
Atomic Force Microscope
Legal Metrology Evaluation
Precision Sphere Measurement
Precision Sphere Measurement
Precision Sphere Measurement
Electromagnetic Immunity Test Facility
Electromagnetic Immunity Test Facility
deadweight machine
deadweight machine
Proving
Ultrasonic image of silicon
Hearing Aid Testing
 NIST's anechoic chamber
laser Tracker
NIST Electrostatic Force Balance
Silicon Staircase
Scanning tunneling microscope
Silicon sphere

 

Manufacturing Engineering Laboratory Skip navigation