![Kilogram](images/cr.jpg) |
Calibration Research: length, mass, force, acceleration, acoustical pressure, measurement uncertainty |
![Machine tool](images/mrp.jpg) |
Material Removal Processes: milling, turning, grinding, lapping, polishing |
![CMM probe](images/cmt.jpg) |
Coordinate and Machine Tools: CMMs, laser trackers, probes, performance, condition based maintenance |
![circuit board](images/ll.jpg) |
Interoperability / Integration: sensor interfacing and networking, open architecture control, product data standards, conformance testing, STEP |
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![Tin atoms](images/tin2.jpg) |
Surface and Nano: roughness, stylus instruments, interferometry, STM, AFM, SEM, Linewidth, photomasks |
![XCALIBER](images/lo.jpg) |
Laser and Optics: interferometry, striae, air refractivity, surface finish, EUVL |
![simulation](images/mvm.jpg) |
Simulation, Visualization and Modeling: Simulation architectures and interfaces, distributed simulation standards,
neutral models and prototypes |
![Machinist](images/ftd.jpg) |
Fabrication Technology: Fabrication support for NIST staff |
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