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Laser and Optical Metrologoy links Site Details Frequently Searched For Other Information |
Optical MetrologyLocated within the Instrumentation Division, the Optical Metrology lab (OML) has been actively involved in the improvement of the quality of optical components in use at synchrotron radiation beamlines throughout the world. Established in 1983, the OML has pioneered the use of non-contact optical profiling instruments to measure the surface figure and surface roughness on large aspheric mirrors used to reflect x-rays at extreme grazing incidence angles. A collaboration with Dr. Eugene L. Church from Picatinny Arsenal, Dover, NJ, has resulted in an improved understanding of the fundamental nature of surface roughness in terms of fractal geometry and in comprehensive models of instrument performance. The activities of the OML divide into three basic areas:
Last Modified: Thursday, 16-Feb-2006 10:47:03 EST |