Process Characterization: Overview and Impetus
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Statisticians Collaborate with Researchers to Characterize
Complex Processes
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NIST statisticians collaborate with other researchers
throughout the NIST Laboratories and also with their
industrial partners to characterize complex processes and to
address measurement and standards aspects of physical science,
engineering, and information technology. Together with
subject-matter experts, NIST statisticians develop techniques
for evaluating complex physical processes, complex production
processes, measurement processes, for tying measurement
processes to accepted standards, and for ensuring the quality
of measurements.
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Examples of Process Characterization
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Statisticians develop probabilistic models for physical
processes and statistical models for combined uncertainty
analysis. Current examples of process characterization
include stochastic models for high-speed communications
using optical fibers, new measurement methods for
characterizing the complex permittivity of dielectric
materials (widely used throughout electronics, microwave,
communication, and aerospace industries), statistical models
for polymer temperature and pressure measurement during
fabrication, and characterization of high-speed oscilloscopes
for use in optoelectronic device metrology, in nonlinear
device metrology, and in high-speed digital circuit design.
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Date created: 2/5/2002
Last updated: 2/5/2002
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