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Process Characterization: Characterization of High-Speed Optoelectronic Devices

Introduction In collaboration with the Optoelectronics Division and the Radio Frequency Technology Division of the NIST Electronics and Electrical Engineering Laboratory (EEEL), SED has demonstrated that observed high speed optoelectronic signals can be corrected for the joint effect of time base distortion, timing jitter, drift, and impedance mismatch distortion.

Background/Impetus
Customers
Goals
Impact
SED Milestones
R&D Team
Achievements
Publications
Presentations

Additional technical information on this project is available at:

Background/
Impetus
High bandwidth measurements are needed to support high-performance systems which take advantage of the potential bandwidth of optical fiber. Systems presently being installed operate at 5 to 10 gigabits per second using pure optical time division multiplexing (OTDM) and research is being done on the next generation of OTDM systems at 20 to 40 gigabits per second. Methods are needed to characterize the impulse and frequency response of high-speed sources and detectors to at least the third harmonic of the system modulation rate.
Customers The customers for the high-speed optoelectronic devices project include:
  • Optical telecommunications industry;
  • optical interconnect, detector, component, and test equipment manufacturers;
  • gigabit Internet network manufacturers; CATV industry;
  • satellite TV industry;
  • tethered microwave antenna manufacturers;
  • SONET/SDH (synchronous optical network/synchronous digital hierarchy industry);
  • fiber channel industry.
Specific examples are: Agilent, Tektronix, Scientific Atlanta.
Goals The goal of the high-speed optoelectronic devices project is:
  • To measure and characterize the impulse response of high-speed optoelectronic devices.
Impact The impact of the high-speed optoelectronic devices project was that SED demonstrated that observed high speed optoelectronic signals can be corrected for the effects of drift, jitter, timebase distortion and impedance mismatch distortion. As a result, the feasibility of a proposed calibration service for a multibillion dollar industry was demonstrated.
Milestones for the high-speed optoelectronic devices project are:
FY02 Milestones
  • Develop and release alpha version public domain software for signal alignment, time base distortion correction and jitter correction.
  • Write a paper on jitter estimation.
  • Develop a method for estimating the bias of timebase distortion estimates.
FY01 Milestones
  • Develop adaptive estimator of RMS jitter noise for complex signals.
  • Develop Monte Carlo method for quantification of random and systematic error in power and phase spectra for signals corrected for alignment error, time base distortion and timing jitter noise.
FY00 Milestones
  • Develop a procedure for bias-correction of RMS jitter noise estimator for time base distortion measurements.
  • Develop method for quantification of random uncertainty of time base distortion estimator.
FY99 Milestones
  • Develop a least-squares procedure for estimation of timebase distortion.
FY98 Milestones
  • Compare existing timebase distortion estimation methods.
  • Develop improved signal alignment methods, and compare to existing methods.
R&D Team Kevin Coakley, Statistical Engineering Division, ITL

Jack Wang, Statistical Engineering Division, ITL

Paul Hale, Optoelectronics Division, EEEL

Tracy Clement, Optoelectronics Division, EEEL

Don DeGroot, Radio Frequency Technology Division, EEEL

Achievements The achievements of the high-speed optoelectronic devices project include:
  • A least-squares procedure for estimating the timebase distortion of sampling oscilloscopes was developed. The procedure can also accurately estimate the order of the harmonic model that is used to account for the amplitude nonlinearity of the sampling channel.
  • Examined the bias of using the method of the first-order approximation to estimate the additive and time jitter noises in timebase distortion measurements. Developed a procedure to adjust for the bias in the estimates.
  • Studied the bias and variance of a least-squares timebase distortion estimate that uses multiple sets of waveforms. Based on simulations, a method for calculating the random uncertainty of the timebase distortion estimate is proposed.
  • Developed a program to study the effects of amplitude and phase drifts, as well as jitter error on the estimation of timebase distortion.
Publications The publications resulting from the high-speed optoelectronic devices project include:
  • C. M. Wang, P. D. Hale, K. J. Coakley, and T. S. Clement, "Uncertainty of oscilloscope timebase distortion estimate," IEEE Transactions on Instrumentation and Measurement, in press.
  • K. J. Coakley and P. D. Hale, "Alignment of noisy signals," IEEE Transactions on Instrumentation and Measurement, 50 (1), pp. 144-149 (2001).
  • P. D. Hale, T. S. Clement, K. J. Coakley, C. M. Wang, D. C. DeGroot, and A. P. Verdoni, "Estimating the magnitude and phase response of a 50 GHz sampling oscilloscope using the 'nose-to-nose' method," 55th ARFTG Conference Digest, pp. 35-42 (2000).
  • P. D. Hale, and C. M. Wang, "Heterodyne system at 850 nm for measuring photoreceiver frequency response," Technical Digest of Symposium on Optical Fiber Measurements, pp. 117-120 (2000).
  • T. S. Clement, P. D. Hale, K. J. Coakley, and C. M. Wang, "Time-domain measurement of the frequency response of high-speed photoreceivers to 50 GHz," Technical Digest of Symposium on Optical Fiber Measurements, pp. 121-124 (2000).
  • P. D. Hale, and C. M. Wang, "Calibration service of optoelectronic frequency response at 1319 nm for combined photodiode/rf power sensor transfer standards," Special Publication 250-51, National Institute of Standards and Technology, Gaithersburg, MD (1999).
  • C. M. Wang, P. D. Hale, and K. J. Coakley, "Least-squares estimation of time-base distortion of sampling oscilloscopes," IEEE Transactions on Instrumentation and Measurement, 48 (6), pp. 1324-1332 (1999).
Presentations The presentations resulting from the high-speed optoelectronic devices project include:
  • K. J. Coakley, "Correcting Optical Impulse Response Measurements for Time Base Distortion, Drift and Jitter," Telecommunications Industry Association and International Electrotechnical Commission Symposium, Koloa, HI, January 23, 2002.
  • K. J. Coakley, "Some Statistical Problems in Optoelectronics," Institute of Statistics & Decision Sciences, Duke University, Durham, NC, November 10, 2000.
  • K. J. Coakley, "Statistical Problems in Optoelectronics," National Research Laboratory of Metrology, Tsukuba, Japan, May 15, 2000.
  • K. J. Coakley, "Statistical Problems in Optoelectronics," Telcordia Technologies, Morristown, NJ, March 30, 2000.
  • K. J. Coakley, "Alignment of Noisy Signals," Department of Statistics, Colorado State University, Ft. Collins, CO, October 25, 1999.

Date created: 2/6/2002
Last updated: 2/6/2002
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