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Aug. 26, 2005

  In This Issue:
bullet Detecting Anthrax Proteins at Ultralow Concentrations
bullet

Improving Security of Handheld IT Devices

bullet NIST Develops 'Toolbox" for Manufacturing Systems
bullet

Consortium Seeks Comment on Gene Expression Roadmap

bullet IT Program Hopes to Foster Better Security Checklists
  Quick Links:
bullet Evaluation Gauges Results from Machine Translation
bullet Conference to Highlight New Biometric Technologies
bullet Industrial Physics Forum: Innovation Infrastructure
bullet Practice Guide Describes Engineering Standards

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Detecting Anthrax Proteins at Ultralow Concentrations

A new laboratory method for quickly detecting active anthrax proteins within an infected blood sample at extremely low levels has been developed by researchers at the National Institute of Standards and Technology (NIST), the U.S. Army Medical Research Institute of Infectious Diseases and the National Cancer Institute.

computer model of anthrax proteins, protective antigen 63 and lethal factor

A computer model shows side and top views of two different proteins produced by anthrax bacteria. The green molecule is "protective antigen" (PA), which spontaneously forms pores that penetrate organic membranes such as cell walls. The yellow molecule is "lethal factor (LF)." When a voltage is applied across a membrane studded with PA pores, both positive and negative ions flow through. Once LF binds to the pore, however, current only flows in one direction.

Image credit: T. Nguyen, National Cancer Institute

Click on image for a high resolution version
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Current detection methods rely on injecting live animals or cell cultures with samples for analysis and require up to several days before results are available. Described* in an upcoming issue of the Journal of Biological Chemistry, the new method produces unambiguous results in about an hour. The researchers hope the system will ultimately be useful in developing fast, reliable ways to diagnose anthrax infections or to quickly screen large numbers of drugs as possible therapies for blocking the bacteria's toxic effects.

The method works by detecting changes in current flow when anthrax proteins are present in a solution. An anthrax protein ironically called "protective antigen" spontaneously forms nanometer-scale pores that penetrate the surface of an organic membrane. When a voltage is applied across the membrane, positively charged ions flow freely in both directions through the pore. When additional anthrax proteins called lethal factor (LF) or edema factor (EF) are present, however, the proteins bind to the outside of the pore and shut down the flow of ions in one direction. This change in current flow depends on the concentration of the proteins in the solution and can detect amounts as low as 10 picomolar (10 trillionths of a mole per liter).

"We hope this system will lead to a method for rapidly screening agents that inhibit the binding of LF or EF to these pores," says NIST's lead investigator John Kasianowicz.

Live anthrax antibodies seem to do exactly that. When antibodies were present in the test solution and then LF was added, the current flow remained unchanged, indicating that the anthrax proteins were unable to bind properly. The long-term goal would be to find drugs with few side effects that also interfere with this binding process.

* K.M. Halverson, R.G. Panchal, T. Nguyen, R. Gussio, S.F. Little, M. Misakian, S. Bavari and J.J. Kasianowicz, "Anthrax Biosensor: Protective Antigen Ion Channel Asymmetric Blockade," Journal of Biological Chemistry, slated for a November issue, posted online Aug. 8, 2005.

Media Contact:
Michael Baum, michael.baum@nist.gov, (301) 975-2763

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Improving Security of Handheld IT Devices

Handheld devices such as personal digital assistants are becoming indispensable tools for today’s highly mobile workforce. Small and relatively inexpensive, these devices can be used for many functions, including sending and receiving e-mail, storing documents, delivering presentations and remotely accessing data.

While their small size can be an advantage, it also can be a disadvantage since handheld devices can be easier to misplace or to steal than a desktop or notebook computer. If they do fall into the wrong hands, gaining access to the information they store can be relatively easy. The National Institute of Standards and Technology (NIST) has recently issued two reports aimed at making it harder for unauthorized users to access information from these devices.

Proximity Beacons and Mobile Device Authentication (NISTIR 7200) describes how two different kinds of location-based authentication mechanisms that use signals from wireless beacons can be used to authenticate handheld device users. If the user is in an unauthorized location or a location outside a defined boundary, access will be denied or an additional authentication mechanism must be satisfied before gaining access.

While many organizations use smart cards for security, they require a card reader that can be nearly as large as the handheld device. Smart Cards and Mobile Device Authentication (NISTIR 7206) describes two types of smart cards that use standard interfaces supported by handheld devices, avoiding the use of more cumbersome, standard-size smart card readers.

Both reports describe these innovative authentication mechanisms and provide details on their design and implementation. The reports are available at http://csrc.nist.gov/publications/nistir/index.html.

Media Contact:
Jan Kosko, janice.kosko@nist.gov, (301) 975-2767

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NIST Develops 'Toolbox' for Manufacturing Systems

Ask any handyman what’s the most important thing he needs to get the job done and he’ll probably say his toolbox. Thanks to the National Institute of Standards and Technology (NIST), there’s now a toolbox to help those involved in the development, validation and implementation of international standards for manufacturing systems. This toolbox is a Web site that contains links to databases, software packages, test suites and other information technology support products and tools that have been developed in recent years by NIST’s Manufacturing Systems Integration Division.

For example, one of the tools in the testing and evaluation support section contains a “naming assister” that provides guidance with consistent naming conventions for elements and types based on ISO 11179 (the international metadata standard). A tool in the semantic technology support section lets users try their hand at a “20 Questions” exercise to capture exactly how their own applications represent processes and activities in terms of the Process Specification Language. (PSL is a neutral language that helps manufacturers exchange process information among different applications in their company.) The third part of the toolbox—application support—features Expect, NIST’s software used to glue together different computer applications and automate the result. Finally, the standards development section supplies tools for dealing with various aspects of the STandard for Exchange of Product model data (STEP, formally known as ISO 10303), which provides a neutral format that enables the exchange of data between proprietary systems.

To access the NIST MSID Products and Tools Web site, go to http://www.mel.nist.gov/msid/msidprod.htm.

Media Contact:
Michael E. Newman, michael.newman@nist.gov, (301) 975-3025

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Consortium Seeks Comment on Gene Expression Roadmap

The External RNA Controls Consortium (ERCC) has issued for comment a draft plan for the selection and qualification of candidate RNA sequences, to be used as controls for assessing the performance of gene expression experiments. The ERCC is an ad hoc group of about 50 companies, universities and federal laboratories joined to develop materials and tools that will be used to establish the performance of DNA microarrays and other quantitative experiments that measure gene expression. The National Institute of Standards and Technology (NIST) is a founding member and host of the consortium.

Gene expression—how and under what conditions specific genes produce which proteins, and why—is one of the most important frontiers in bioscience today, promising a better understanding of fundamental life processes and the discovery of important biomarkers for early disease diagnosis. The field was advanced enormously by the development of powerful technologies such as quantitative, real-time reverse transcriptase polymerase chain reaction (QRT-PCR) and the DNA microarray. Both techniques for analyzing gene expression, however, are complex, involve multiple steps, various detection technologies and many potential sources of error. At present, it is difficult to establish the quality of any particular experiment.

The ERCC proposes to develop consistent, well-characterized RNA samples that can be added into gene expression assays as a check on the performance of the measurement system. These proposed “external RNA controls”—approximately 100 are envisioned—would be chosen to deliver comparable results across the range of available microarray and QRT-PCR systems.

Because selecting a set of RNA controls that perform consistently is essential to the success of the project, the ERCC is planning extensive experimental qualification of the set. They are publishing for public comment a draft specification of its proposed methods for testing and selecting the final set of external RNA controls. The document, “Proposed Methods for Testing and Selecting the ERCC External RNA Controls,” is available on-line at www.cstl.nist.gov/biotech/Cell&TissueMeasurements/GeneExpression/ERCC.htm. Comments can be forwarded via e-mail to ercc@NIST.gov.

The ERCC will hold a workshop on Oct. 4-5, 2005, at the Lister Hill Center Auditorium at the National Institutes of Health in Bethesda, Md., to discuss the draft protocol and review comments. For further information send e-mail to ercc@nist.gov.

Media Contact:
Michael Baum, michael.baum@nist.gov, (301) 975-2763

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IT Program Hopes to Foster Better Security Checklists

Widespread electronic attacks on computer systems have become commonplace with threats ranging from remotely launched attacks on network services to malicious code spread through e-mails. To make matters worse, vulnerabilities in IT products such as operating systems are discovered almost daily. But, securing today’s complex systems and products can be very complicated, arduous and time-consuming for even the most experienced system administrator.

While the solutions to IT security are complex, one basic, yet effective tool is the security configuration checklist, sometimes called a lockdown or hardening guide. Basically, a checklist is a series of instructions for configuring an information technology (IT) product to a baseline or benchmark level of security.

The National Institute of Standards and Technology (NIST), with sponsorship from the Department of Homeland Security (DHS), has developed a program to facilitate the development and sharing of security configuration checklists. The program helps developers make checklists that conform to common operational environments; provides guidelines for making better documented and more usable checklists; provides a managed process for reviewing, updating and maintaining checklists; and includes an easy-to-use repository of checklists.

A new NIST report, Security Configuration Checklists Program for IT Products—Guidance for Checklists Users and Developers (NIST Special Publication 800-70) gives an overview of the NIST Checklist Program, explains how to retrieve checklists from NIST's repository and provides general information about threats and baseline technical security policies for associated operational environments. It also describes the policies, procedures and general requirements for checklist developers to participate in the program. The report and other information is available at http://checklists.nist.gov.

Media Contact:
Jan Kosko, janice.kosko@nist.gov, (301) 975-2767

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Quick Links

Evaluation Gauges Results from Machine Translation

The National Institute of Stanards and Technology has posted at www.nist.gov/speech/tests/mt the results of the NIST 2005 Machine Translation Evaluation (MT-05), part of an ongoing series assessing the effectiveness of the technologies underlying computerized text language translation systems. NIST conducts these evaluations in order to support machine translation (MT) research and help advance the state of the art in MT technology. MT-05 consisted of two tasks where each task required performing translation of text from a given source language into the target language. The source languages were Arabic and Chinese, and the target language was English. Research algorithms and translation system output—not the systems themselves—were studied in MT-05. These tests should not be considered a product-testing exercise.

Therefore, MT-05 results are not to be construed or represented as endorsements of any participant's system or commercial product, or taken as official findings on the part of NIST or the U.S. government.

 

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Conference to Highlight New Biometric Technologies

The Biometrics Consortium Conference 2005 will address the latest trends in research, development, testing and application of biometric technologies, especially in the area of homeland security. Slated for Sept. 19-21, 2005, in Arlington, Va., the conference is sponsored by the National Institute of Standards and Technology (NIST), along with seven other federal, state and non-profit agencies. Topics covered will include advances in biometric technologies such as fingerprinting, iris scans, facial and multimodal biometrics; methods for measuring biometric effectiveness; biometric standards and adoption; countermeasures and spoofing; and societal and political implications. Government programs, large scale implementations, security of biometrics, and biometrics and physical access control will be addressed.

More than 100 speakers will represent the biometrics industry, universities and federal agencies such as NIST, the National Security Agency and the Department of Homeland Security. More than 70 organizations also will provide exhibits and information on biometric technology. For more information and to register online, go to http://www.nist.gov/bc2005.

Reporters who plan to cover the conference should send an e-mail to Jan Kosko (kosko@nist.gov) by close of business Wednesday, Sept. 14, and must show credentials (a news media badge with a photo or a photo ID with a business card) to gain admission to the conference.

 

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Industrial Physics Forum: Innovation Infrastructure

Industry executives, research managers, academics and science policy decision makers are invited to attend The Industrial Physics Forum on Nov. 6-8, 2005, at the National Institute of Standards and Technology (NIST) campus in Gaithersburg, Md. The forum is sponsored annually by the American Institute of Physics to keep participants current on the themes and issues affecting the physics community. This year's theme is Advancing Infrastructure for Innovation. The first day of the forum will focus on the latest research at NIST in areas such as public safety and security, nanotechnology, and biosystems and health, and will include laboratory tours. The second day will focus on policy issues and current trends affecting the physics industry, as well as a "Frontiers in Physics" session exploring hot topics such as quantum information and evolution. For further information and to register, see http://www.aip.org/ca/2005/05mtg.html.

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Practice Guide Describes Engineering Standards

The National Institute of Standards and Technology (NIST), in cooperation with the ASM International Surface Engineering Committee, has issued a guide to published standards for the measurement and characterization of inorganic material surfaces. NIST Recommended Practice Guide: Surface Engineering Measurement Standards for Inorganic Materials (NIST Special Publication 960-9) directs the user to appropriate standards based on material type, property of interest, and measurement or characterization method. Each summary includes a general description of the standard, the intended application, specimen requirements, type of data produced and the limits of the method. NIST SP 960-9 may be downloaded in Adobe Acrobat format at www.msel.nist.gov/practiceguides/SP960_9.pdf
(.pdf; download Acrobat Reader). A free print copy may be obtained by contacting Joyce Harris, (301) 975-6045, joyce.harris@nist.gov.



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Editor: Gail Porter

Date created: 8/26/05
Date updated: 8/26/05
Contact: inquiries@nist.gov