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Nov. 24, 2004

  In This Issue:
bullet Four Organizations Receive Presidential Quality Award
bullet Ultrafast Laser Speeds Up Quest for Atomic Control
bullet Planning for Extreme Events by Understanding Risk
bullet New Project Takes Measure of Plastic Electronics
  Quick Links:
bullet NIST Co-funded Technologies Tapped for Scientific American 50

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Four Organizations Receive Presidential Quality Award

Bama employees working hand-held pie line.

Bama employees working hand-held pie line.

President George W. Bush and Commerce Secretary Don Evans announced on Nov. 23, 2004, that four organizations have been selected to receive the 2004 Malcolm Baldrige National Quality Award, the nation’s only Presidential award for quality and organizational performance excellence.

The 2004 Baldrige Award recipients are: The Bama Companies, Tulsa, Okla. (manufacturing category); Texas Nameplate Company, Inc., Dallas, Texas (small business category); Kenneth W. Monfort College of Business, Greeley, Colo. (education category); and Robert Wood Johnson University Hospital Hamilton, Hamilton, N.J. (health care category). This is the second time that Texas Nameplate has been named a recipient of the Baldrige Award; the first time was in 1998. Baldrige Award recipients can reapply for the award after five years.

Improvement highlights from these four organizations include:

  • While the overall frozen baked goods industry has remained relatively flat since 1999, Bama’s sales have increased 47 percent and its profit margins have improved 19 percent.
  • Texas Nameplate has cross-trained more than 80 percent of its 39 employees to perform multiple jobs across departments.
  • Student performance at Monfort College of Business consistently has been well above the national mean and in 2003-2004 reached the top 10 percent level.
  • In 1998, Robert Wood Johnson University Hospital implemented the “15/30” program which guarantees that patients coming into the emergency department will see a nurse within 15 minutes and a physician within 30 minutes.

Named after the 26th Secretary of Commerce, the Malcolm Baldrige National Quality Award was established by Congress in 1987 to promote excellence in organizational performance, recognize the quality and performance achievements of U.S. organizations, and publicize successful performance strategies. The Award is managed by NIST in conjunction with the private-sector. For more information on the 2004 Baldrige Award recipients, see www.nist.gov/public_affairs/releases/2004baldrigewinners.htm.

Media Contact:
Jan Kosko, janice.kosko@nist.gov, (301) 975-2767

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Ultrafast Laser Speeds Up Quest for Atomic Control

Just as a satellite requires a boost of power to change from one Earth orbit to a higher one, electrons require an energy boost (in quantum steps) to change from one orbital pattern around the nucleus to another. JILA researchers used pulses of ultrafast laser light to boost the outer electron in rubidium atoms to higher, "excited" levels, then detected the energy released by the atoms in the form of fluorescent light as they "relaxed" back to their natural state. This three-dimensional plot shows changes in the intensity of the light emitted by the atoms in 300 microseconds. The JILA technique should allow scientists to measure and control these "transitions" between atomic energy levels much more efficiently than with conventional methods.

Just as a satellite requires a boost of power to change from one Earth orbit to a higher one, electrons require an energy boost (in quantum steps) to change from one orbital pattern around the nucleus to another. JILA researchers used pulses of ultrafast laser light to boost the outer electron in rubidium atoms to higher, "excited" levels, then detected the energy released by the atoms in the form of fluorescent light as they "relaxed" back to their natural state. This three-dimensional plot shows changes in the intensity of the light emitted by the atoms in 300 microseconds. The JILA technique should allow scientists to measure and control these "transitions" between atomic energy levels much more efficiently than with conventional methods.

It's the scientific equivalent of having your cake and eating it too. A team of researchers from JILA, a joint institute of the Commerce Department's National Institute of Standards and Technology (NIST) and the University of Colorado at Boulder, has developed an efficient, low-cost way to measure the energy levels of atoms in a gas with extremely high accuracy, and simultaneously detect and control transitions between the levels as fast as they occur. The technique is expected to have practical applications in many fields, including astrophysics, quantum computing, chemical analysis, and chemical synthesis.

Described in the Nov. 18 online issue of Science Express,* the method uses ultrafast pulses of laser light like a high-speed movie camera to record in real-time the energy required to boost an atom's outer electrons from one orbital pattern to another. The pulses are so short that scientists can track precisely the fraction of atoms in each energy state and how those populations change with time. Moreover, the atoms respond to subsequent laser pulses cumulatively—the energy adds up over time—which allows fine-tuning to affect specific orbital patterns of interest with a much lower power laser than usual.

All of chemistry depends on the configurations of these outer electrons. The technique promises to make it easier for scientists to systematically understand the radiation "signatures" (or spectra) given off by atoms and molecules as their electrons jump between different energy levels. Ultimately, it should allow improved control of the complex chain of events that combines atoms into desired compounds.

The JILA team is a world leader in applying so-called "frequency combs" to practical science problems. The laser system used in the current work emits a hundred thousand different infrared frequencies at once in individual pulses lasting just femtoseconds (quadrillionths of a second). The JILA researchers used the laser to precisely study the electron energy levels within an ultracold gas of rubidium atoms. The ability to probe atoms with many different laser frequencies simultaneously and to monitor atom responses in real time should allow scientists to study and control systems in a vastly more efficient and precise manner.

*A. Marian, M. C. Stowe, J.R. Lawall, D. Felinto, and J. Ye. 2004. "United time-frequency spectroscopy for dynamics and global structure." Science Express.

Media Contact:
Laura Ost, laura.ost@nist.gov, (301) 975-4034

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Planning for Extreme Events by Understanding Risk

Terrorist attacks like those on Sept. 11, large-scale industrial accidents like Three Mile Island, hurricanes like Andrew, or earthquakes like the one in Northridge, Calif., that killed 60 peoplethese are all what economists call low probability, high consequence events. Making economic decisions about how to prepare for such "extreme events" is a difficult process. Under what circumstances are the benefits of strengthening a building against explosions or earthquakes worth the costs? A new study sponsored by the National Institute of Standards and Technology (NIST) offers strategies for finding answers to such questions.

Conducted by the University of Pennsylvania's Wharton School, the study* found that preparing for extreme events requires an understanding of risk "interdependencies." A security plan, for example, is only as strong as its weakest link. It also requires cooperation between public and private organizations because individuals and organizations often don't take actions to mitigate low probability risks unless there are incentives to do so.

Ultimately, the study authors concluded that dealing effectively with extreme events depends on a complex interplay between risk assessment, perception and management. Risk assessment for a power grid in Ohio needs to include possible negative effects from domino-like failures throughout the northeastern United States and Canada. People perceive risk more clearly when they understand its cumulative effects. More people will wear seatbelts, for instance, if told they have a 33 percent chance of an accident over a 50-year lifetime of driving than if they know there is 0.00001 percent chance for each trip. And risk management is more likely if the economics are attractive. A $1,500 loan to prevent flood damage is more affordable if payments are divided over the life of a 20-year mortgage and if insurance premiums drop as a result of the improvements.

*An electronic copy of Risk Analysis for Extreme Events: Economic Incentives for Reducing Future Losses by Howard Kunreuther, Robert Meyer and Christophe Van den Bulte is available at www.bfrl.nist.gov/oae/oae.html.

Media Contact:
John Blair, john.blair@nist.gov, (301) 975-4261

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New Project Takes Measure of Plastic Electronics

In the future, the phrase smarty pants might be taken quite literally, referring to trousers embedded with electronic “intelligence” so that they change color, for example, in response to their surroundings.

The timing of this vernacular twist will depend on when plastic “chips” become practicalso cheap and reliable that electronic circuits can be printed not only on clothing but also on paper, billboards and nearly anything else. Unlike today's largely silicon-based technologies, organic (carbon-based) materials are flexible, can be processed at low temperatures and lend themselves to large-area applications, such as wall-sized electronic murals.

Before the emerging field of organic electronics can deliver on its commercial promise, however, new measurements, standards and processing capabilities must be developed. Creating many of the requisite tools is the aim of a new five-year research effort at the National Institute of Standards and Technology (NIST).

“Organic electronics is at a stage akin to the very early days of the silicon semiconductor industry,” explains NIST polymer scientist Eric Lin. “Lack of validated diagnostic probes and standardized test and measurement methods is an impediment to progress.”

Unfortunately, the job of filling this void is especially challenging. The range of potential materials for organic electronics—from polymers to nanocomposites—is enormous. The number of synthesis and processing methods under consideration is also daunting. Examples include ink-jet printing, roll-to-roll printing and various ways to coax molecules to self-assemble into components.

Accurate, reliable measurements will help solve current manufacturing issues and speed widespread use of the new microchips. Ultimately, says Lin, NIST plans to develop an “integrated measurement platform.” The envisioned tool will allow scientists and engineers to predict the performance of organic electronic devices based on composition, structure and materials properties.

Media Contact:
Mark Bello, mark.bello@nist.gov, (301) 975-3776

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Quick Links

NIST Co-funded Technologies Tapped for Scientific American 50

Three path-breaking industrial R&D projects co-sponsored by the National Institute of Standards and Technology’s Advanced Technology Program (ATP) are among the 50 technologies and companies cited by the journal Scientific American for “outstanding technology leadership” in business in 2003-2004.

The three technology innovations include:

The "Scientific American 50" appears in the December issue of magazine and at www.sciam.com.

 

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Editor: Gail Porter

Date created:11/22/04
Date updated:11/23/04
Contact: inquiries@nist.gov