Bayesian Metrology Project

The NIST Statistical Engineering Division is developing the use of Bayesian statistical methods to solve NIST metrology problems as a NIST Competence Project.

Overview Impetus Customers Goals Milestones Achievements Future Events/Activities Data Gallery Contacts/Personnel Additional information

The above graph contains a link to a Bayesian analysis of the Michelson light data (in PDF format). If you cannot view PDF format files from your browser, the Adobe Acrobat Reader can be freely downloaded. You may also contact the SED webmaster to request a printed copy of the document.

Date created: 8/28/2001
Last updated: 9/12/2001
Please email comments on this WWW page to sedwww@nist.gov.