To better study micromagnetic information storage materials, NIST
scientists developed scanning electron microscopy with polarization analysis, or
SEMPA,
to measure and display the spin direction of electrons in magnetic materials.
Studies with this tool are helping U.S. industry figure out how to pack more
electronic data bits into smaller spaces on computer hard drives and in
thin-film, magnetoresistive memories. Several U.S. companies are taking
advantage of the opportunity to work with NIST to obtain measurements necessary
to develop the next generation of data storage systems. |
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Magnetic domains in amorphous ferromagnet. |