|
 Division Overview
Division Organization
Sources, Detectors and Displays Group
Optical Fiber and Components Group
Optoelectronics Manufacturing Group
Staff Directory
Employment
Opportunities
How to
Contact Us
Optoelectronics Division (815.00)
National Institute of
Standards and Technology
325 Broadway
Boulder, CO
80305-3328
Directions
Phone: (303)
497-5342
FAX: (303) 497-7671, -3387
For information on other federal programs, see
NIST is an agency of
the U.S.
Department of Commerce
Disclaimer
Privacy
Statement/Security Notice
FOIA
Page updated: 08/29/2008 |
Adobe Acrobat Reader (version 4.0x or greater) will be needed to view many of these documents. If you do not have this program, you may download it free of charge. The software is identified in order to assist users of this information service. In no case does such identification imply recommendation or endorsement by the National Institute of Standards and Technology. |
August 2008 |
EEEL Sets Record for Detection Efficiency with Single Photon Detectors
Researchers in the Optoelectronics Division of EEEL have demonstrated a record-high system detection efficiency of 95 ± 2 % in counting single photons in the near-infrared wavelength region. Adriana Lita, Sae Woo Nam, and Aaron Miller (guest researcher from Albion College) designed, fabricated, and evaluated fiber-coupled, superconducting transition-edge sensors (TESs) optimized for absorption at the telecommunication band wavelengths of 1550 nm and 1310 nm.
Click here for more information about the record-high system detection efficiency.
|
April 2008 |
EEELDevelops Terahertz Imaging System for Contraband Detection
The Optoelectronics Division of EEEL has developed and demonstrated an ultra-wideband, millimeter-wave/terahertz detector array for use in contraband detection and characterized it in a testbed using tools developed by EEEL specifically for terahertz metrology.
Click here for more information about the terahertz detector array.
|
April 2008 |
EEEL Researchers Develop Novel Transfer Standard for High-speed Measurements
Paul Hale and Dylan Williams, EEEL researchers in the Optoelectronics and Electromagnetic Technology
Divisions, have developed a novel transfer for calibrating high-speed instruments used to measure optical
and electrical waveforms. Waveform measurements are required throughout the optical communications,
computer, wireless communications, radar, and remote sensing industries. Waveform measurements verify
signal fidelity and standard compliance for the design and qualification of components and systems.
Click here for more information about the Novel Transfer Standard.
|
|
|
|
|
|
|
