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Infrared Laser Gonioreflectometer Instrument (ILGRI)

 

The bidirectional reflectance distribution function (BRDF) is a measure of the amount of light reflected by a surface from one direction into another. Integrating it over specified incident and reflected solid angles defines the reflectance, which also can be easily related to the absorptance (or emissivity) of a sample.

The BRDF can thus be taken as a fundamental quantity for the optical characterization of an object and it correspondingly is important in a large variety of applications. BRDF is critical to computer image analysis and reconstruction, for applications in targeting, reconnaissance and surveillance, virtual reality systems and simulators, radiative heat transfer, computer graphics, optical testing, telemedicine, robotics, etc.

The Infrared Laser Gonioreflectometer Instrument (ILGRI) is intended to measure the BRDF (as well as the BTDF - bidirectional transmittance distribution function) of flat and structured samples (such as V-grooved surfaces or cavities) in the infrared spectral range. The ILGRI enables the measurement in absolute units (1/sr) of the BRDF and BTDF as functions of 4 variables (2 angular coordinates for incident direction and 2 - for the detector angular position).

For BRDF Definition

Bi-directional Reflectance Distribution Function (BRDF)

$f(\theta_i,\phi_i,\theta_r,\phi_r)=\frac{dL_r(\theta_r,\phi_r)}{dE_i(\theta_i,\phi_i)}$

The complete instrument consists of three main parts: the infrared source section, the sample manipulation section, and the detection section. ILGRI layout showing the main components is depicted below.

Infrared Goniophotometer Instrument

System features:
  • Out-of-plane capability with sample tilt and normal rotation
  • Retro-reflection setup with beamsplitter
  • Set of interchangeable sample mounts
  • Mueller Matrix with linear polarizers and retarders
  • Fixed and tunable wavelength infrared laser to be added

The infrared source section is a line-tunable, stable CO2 laser, together with a suite of optics including mirrors and lenses for beam direction and adjustment, polarizers and retarders for beam polarization control, and polarizers and filters for beam power level adjustment from 1 nW to 1 W. The addition of other laser wavelengths in the infrared is currently underway. The sample manipulation section consists of computer controlled motorized rotation, goniometer and translation stages for alignment and setting the polar and azimuthal angles of incidence with respect to the sample surface. The detector section consists of pyroelectric and MCT detectors, along with an aperture, a lens and polarizers. Two setups are used: one with a beamsplitter and mirror that enable measurements at and close to the retroreflection directions, where the reflected light is folded to the detector and its associated optics (aperture, lens and polarizer), and a second with a direct path to the detector and its optics.The ILGRI also contains several quadrant detectors, which enable alignment of the stages, axes of rotation, sample surface, and input laser beam, all to within 50 µm of each other.

Photo of the input source optics section

Photo of the input source optics section, including CO2 laser, beam conditioning optics and polarizers. The beam is directed to the sample and detector sections located behind the aluminum panels at the top center-left of the picture.

Photo of the sample and detector sections of the ICRI

Photo of the sample and detector sections of the ILGRI. The CO2 beam is incident from the left onto a mirror sample mounted at the intersection of the rotation and cradle goniometer stages. Pyroelectric detectors and viewing optics are located at either end of the double arm held by the detector rotation stage on the optical table.

BRDF of the Rough Graphite sample BRDF of the Polished Graphite sample

BRDF example of two similar graphite samples with different surface finishes. The BRDF is measured at 10.6 µm, in the plane of incidence, each curve represents a different angle of incidence and is plotted versus the viewing angle relative to the sample normal.

Reference

IR optical scattering instrument with out-of-plane and retro-reflection capabilities,
Jinan Zeng and L. Hanssen,
Conference on Lasers and Electro-Optics (CLEO), 22-27 May 2005; 3, 1882-1884 (2005).
Return to Infrared Optical Properties of Materials
For technical information or questions, call:
Leonard Hanssen
Phone: 301-975-2344
Fax: 301-869-5700
E-mail: leonard.hanssen@nist.gov
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Online: November 2006