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The Infrared Fourier-Transform (FTIR) Spectrophotometry Facility
serves as the measurement facility for characterization of the
optical properties of materials in the infrared spectral range of
1 µm to 100 µm, with particular emphasis on the 2 µm
to 20 µm region.
The facility is built around several commercial
FTIR Instruments. Custom specialized accessories have been developed
to enable transmittance and reflectance measurements of a wide
variety of sample types and under the variable control of measurement
geometry, beam polarization, and sample temperature.
Methodologies and new techniques have been
developed for high accuracy measurements. In addition to the directly
measured quantities, these have also been implemented for other
properties such as refractive index and Mueller matrix elements.
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