| Archive | List of SUZAKU Catalogs |
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This database table records high-level information for each Suzaku observation and provides access to the data archive. Each record is associated with a single observation. An observation contains data from all instruments on board Suzaku.
The Suzaku XIS detector units can be configured differently depending on how the user chooses the observation to be carried out. This database table records for each Suzaku observation the different XIS configurations during an observation for all XIS units. The set of parameters that can be configured are: datamode (see also edit mode), window size, on-board window discriminator, on-board grading and event threshold. Each record lists for a given XIS the values set for these parameters in the time interval where they are valid within the observation. Therefore for a given XIS there will be as many records as many different configurations are present within an observation.
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