Polymers Main Page > Staff
Directory > Detail..Christopher M. Stafford , Ph.D. |
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Research ChemistMultivariant Measurement Methods |
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Phone:
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(301) 975-4368
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Fax:
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(301) 975-4924
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Email:
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Mail:
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8542
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Research InterestsMy research interests lie in the areas of polymer surfaces and thin films, design-of experiments for studying polymer adhesion, surface modifications via organosilanes, mechanical deformation of thin films, and thin film mechanical properties.Professional Background2004-present Staff Scientist, Polymers Division, NIST.2002-2004 NRC Postdoctoral Researcher, Polymers Division, NIST. 2001-2002 Postdoctoral Guest Researcher, Polymers Division, NIST. 2001 Ph.D., Polymer Science and Engineering, University of Massachusetts, Amherst. 1996 B.S., Polymer Science and Engineering, University of Southern Mississippi. Awards and HonorsU.S. Department of Commerce Bronze Medal Award (2007)NIST Sigma Xi Young Scientist Award for Excellence in Scientific Research (2006) U.S. Department of Commerce Silver Medal Award (2005) National Research Council Postdoctoral Research Associateship (2002-2004) Selected PublicationsCharacterizing polymer brushes via surface wrinkling.Huang H., Chung J.Y., Nolte A.J., Stafford C.M. Chemistry of Materials, 2007, 19, 6550-6560.
Versatile platform for creating gradient combinatorial libraries via modulated light exposure.
Anisotropic wetting on tunable micro-wrinkled surfaces.
Buckling modes of elastic films on elastic substrates.
Effect of surface properties on wrinkling of ultrathin films.
Elastic moduli of ultrathin amorphous polymer films.
Measuring the modulus of soft polymer networks via a buckling-based metrology.
Generating thickness gradients of thin polymer films via flow coating.
Probing the interfacial adhesion strength in compositional libraries of epoxy films.
Combinatorial and high-throughput measurements of thin film modulus.
Evaluation of temperature-dependent adhesive performance via combinatorial probe tack measurements.
A new design for high-throughput peel tests: statistical analysis and example.
A multilens measurement platform for high-throughput adhesion measurements.
A new 'wrinkle' in nanometrology.
A buckling-based metrology for measuring the elastic moduli of polymeric thin films.
A rapid prototyping technique for the fabrication of solvent-resistant structures.
Techniques for combinatorial and high-throughput microscopy: Part 1: Gradient specimen fabrication for polymer thin film research.
Controlled adsorption of end-functionalized polystyrene to silicon-supported tris(trimethylsiloxy)silyl monolayers.
Expansion of polystyrene using supercritical carbon dioxide: Effects of molecular weight, polydispersity, and low molecular weight components. |
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NIST Materials Science & Engineering Laboratory - Polymers Division |