Combinatorial Adhesion & Mechanical Properties
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Motivation
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NIST, MSEL, and the Polymers Division are dedicated to developing
unique facilities and analytical tools for garnering and harvesting
knowledge critical to structure-property relationships, with
a particular emphasis on advanced manufacturing and nanometrology.
Mapping these complex structure-property-processing relationships
is an ideal application for combinatorial and high-throughput
(C&HT) methods and can facilitate a better understanding
of fundamental contributions to material properties (i.e., surface
energetics, chemical interactions, entanglements, confinement)
critical to nanometrology and manufacturing.
We are developing combinatorial measurement tools for mapping
the physical, chemical and molecular level contributions to
the engineering properties of materials.
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Approach
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 Design,
develop, and apply a suite of C&HT testing platforms that
probe critical materials properties, with an emphasis on interfacial
measurements of adhesion and metrologies for thin film mechanics.
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 Our
measurement infrastructure will leverage the partnerships with
NCMC members to identify relevant material systems and library
designs that enable the rapid identification of structure-property
relationships critical for adhesive and coating performance.
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Highlights
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Innovative Approaches to C&HT Peel Tests
We are developing devices and measurement strategies that meld
the peel test construct with combinatorial and high-throughput
(C&HT) methods.
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A. Chiche, et al. Meas. Sci. Technol., submitted. |
Axisymmetric Adhesion Tests
We are developing instruments that permit high-throughput (and
high value) measurements of adhesion across combinatorial libraries
with the si-multaneous ability to visualize debonding mecha-nisms.
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A. Forster, et al. Meas. Sci. Technol., submitted |
Elastic Moduli of Polymer Films and Coatings
We have established a novel buckling-based metrology to study
the mechanical properties of thin films and
coatings.
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| C.M. Stafford, et al. Nat. Mater., in press |
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Customers and Impact
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Technical Accomplishments
Developed / applied statistical treatment in order to define
standard uncertainties and gradient step size in C&HT peel
tests.
Benchmarked MCAT measurements against single lens tests for
the work of adhesion between a model system of glass and PDMS
Integrated temperature gradient stage into probe tack testing
platform for testing of soft adhesives (PSAs)
Designed / applied innovative approach to measure the modulus
of thin and ultra-thin polymer films
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Recent Outreach
Co-organized conference session at Adhesion Society Meeting
Published > 8 publications and made > 14 contributions
at national meetings
NCMC Focus Project, High Throughput Measurements of Epoxy
Adhesion (2 industrial partners)
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NIST Contributors
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Christopher M. Stafford
Aaron M. Forster
Arnaud Chiche
Seung-ho Moon
Martin Y.M. Chiang
Gale A. Holmes
Kevin Van Workum
Wen-Li Wu
Michael J. Fasolka
Alamgir Karim
Eric J. Amis
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