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The Electronics Materials Group provides standard measurements and data, develops and applies in situ measurements on materials and material assemblies having micrometer- and submicrometer-scale dimensions, quantifies the divergence of material properties from their bulk values as dimensions are reduced and interfaces contribute strongly to properties, and develops fundamental understanding of materials needed in future semiconductor electronics applications. The goal of this group is to be the key resource within the Federal Government for materials metrology development for commercial semiconductor electronics manufacturing.
 
Organic Electronics
  • Moisture Transport through Ultra-Low Permeation Barriers
  • Chemistry and Orientation with NEXAFS Spectroscopy
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    Nanoimprint Lithography
  • Pattern Transfer and Stability
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    Polymers for Next-Generation Lithography
  • Dissolution Fundamentals
  • Surface and Bulk Chemistry of Chemically Amplified Photoresists
  • NIST-Industry Partnerships
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    Dimensional Metrology with Small Angle X-ray Scattering
  • Sidewall Angle Metrology
  • Dimensional Changes during Fabrication
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    Characterization of Porous Low-k Dielectric Thin Films
     
     
     
     
     
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    Electronics Materials Group
    Polymers Division
    Materials Science and Engineering Laboratory

     
    NIST Polymers Division logo